Dual-mode self switching radiation hardening clock generation circuit based on phase-locked loops

Abstract

The invention provides a dual-mode self switching radiation hardening clock generation circuit based on phase-locked loops, which is mainly composed of two independent phase-locked loops, a delay unit, an error detection unit and a clock selection unit. The two independent phase-locked loops are charge pump phase-locked loops not subjected to radiation hardening, and used for providing corresponding clock output; the delay unit realizes the delay of output signals of the phase-locked loops; the error detection unit is used for detecting whether two output signals of a phase frequency detector in a main phase-locked loop are right and outputting corresponding indication signals; and the clock selection unit performs selective output on the delayed output of the two phase-locked loops as the final output. The dual-mode self switching radiation hardening clock generation circuit based on the phase-locked loops provided by the invention can eliminate interference of a single event effect in a radiation environment on a circuit working state to a great extent, ensure the stability of the phase-locked loops as clock signals, improve the reliability of the system, and has the advantages of being easy in implementation, small in area, low in power consumption and so on.

Description

technical field [0001] The invention relates to a clock generation circuit based on a phase-locked loop, in particular to a dual-mode self-switching radiation-resistant hardened clock generation circuit, which can effectively eliminate and suppress single-event transient (SET) effects. Background technique [0002] With the continuous shrinking of the feature size of integrated circuits, the single event transient (SET) effect caused by the impact of high-energy particles in the space radiation environment cannot be ignored. A stable high-speed system clock is the key to ensure the high-speed and stable operation of the system. The single-event transient (SET) effect can not only make the output clock signal of the phase-locked loop wrong, but the wrong clock will also cause data transmission errors and even paralyze the entire system. [0003] In view of the seriousness of the single event effect, it is very necessary to use a phase-locked loop with a radiation-hardened des...

AI Technical Summary

Problems solved by technology

Since there are many sensitive nodes inside the phase-locked loop, only the nodes with greater influence can be reinforced and designed, which only reinforces the SET effect from a high probability and reduces the error rate; the other is to systematically Level reinforcement, that is, three-mode redundancy reinforcement, because this method copies the phase-locked loop three times, it consumes a lot of power consumption and area

Images