Single event transient resistant clock tree structure

Abstract

The invention discloses a single event transient resistant clock tree structure, comprising a root node clock drive unit, sub-node clock drive units and leaf node clock drive units. The root node clock drive unit and the sub-node clock drive units are clock phase inverters or buffers. The leaf node clock drive units are two-way filters. The two-way filters can eliminate single event transient pulses which are generated on input signals, wherein the pulse widths of the single event transient pulses are smaller than delay time set in the filters, and the same input signal outputs two ways of non-interfering output signals. Each two-way filter drives the certain number of two-clock single event resistant time sequence units. According to the clock tree structure, the single event transient resistant capability of a clock tree network is clearly improved, the probability that the single event transient pulses are generated on any clock node or a plurality of clock tree nodes when the clock tree network is bombarded by radiation events can be effectively reduced; and compared with an integrated circuit realized in a time sequence unit single event transient reinforcement mode, the clock tree structure is characterized by low power consumption, fast speed and small area.

Description

technical field [0001] The invention relates to the field of clock reinforcement, in particular to an anti-single-event transient clock tree structure, and belongs to the technical field of anti-radiation design. Background technique [0002] The radiation produced by high-energy protons or high-energy neutrons hitting the atomic nucleus and the heavy nuclear particles in cosmic rays can cause changes in the state of the circuit, such as transients in combinational logic and bit flips in storage-type units. This effect is the effect of a single particle The result is often called single event effect. For advanced nanotechnology nodes, the research on anti-single event hardening technology pays more attention to the prominent single event upset (SEU), single event transient (SET) and single event soft error events, especially SET events, accompanied by the increase in device spacing. Zooming out, the most direct impact is that the bombardment of a single particle will cause ...

AI Technical Summary

Problems solved by technology

The usual SET reinforcement method will use filtering technology. Compared with redundant technology, the method of using filtering technology to filter out single-event pulses introduces relatively little overhead. The specific implementation method is to add filtering circuits to the sensitive ports inside the sequential unit. Filter out transient pulses below a certain width (Δt) on the input signal, but it is worth noting that in the prior art, the filter circuit itself applied in the sequential unit is vulnerable to SET damage, and the use of the filter will introduce additional Sensitive body, when the particle bombards the filter output node, the SET pulse generated propagates to the internal storage circuit, causing the wrong flip of the stored data. Although this method avoids the global signal (such as clock signal) single-event transient-triggered multi-unit single-event upset events, but due to the introduction of additional sensitive bodies, it also increases the probability of single-sequential unit single-event upset

In addition, the clock signal SET reinforcement method of the sequential unit increases the area of ​​the filter by one filter area per sequential unit, and the power consumption overhead caused by the reinforcement will increase sharply as the frequency increases. These overheads are very important for the pursuit of performance (low power consumption , high speed) advanced process node integrated circuits are intolerable

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