Double-light-source yarn flaw detection method

Abstract

A double light source detection method for yarn defect detection, the detection system for realizing the detection method includes a first light source detection unit and a second light source detection unit, the light colors of the first light source and the second light source are different, and the first light source detection The detection optical axes of the unit and the second light source detection unit are perpendicular to the moving direction of the yarn to be detected, while the detection optical axes of the first light source detection unit and the second light source detection unit are orthogonal; the double light source detection method includes the following steps: 1) Calculate Output voltage U of the first light source detection unit R and the second light source detection unit output voltage U G , the standard diameter set by the detection yarn is d 0 , calculate the standard voltage U0 in yarn detection; 2) Calculate the voltage output △ U of the diameter change in the horizontal direction of the yarn R and the voltage output △U of the diameter change in the vertical direction of the yarn G ;3) by ΔU R and ΔU G Determine the type of defect. The invention has low cost, simple system, and can simultaneously detect yarn thickness defects and flat defects.

Description

technical field [0001] The invention relates to the field of photoelectric detection of yarn quality, in particular to a detection method for yarn defect detection using a double light source mode. Background technique [0002] Since the reform and opening up, my country's textile industry has developed rapidly, and the overall scale and output value have been greatly improved. At present, the output value of my country's textile industry has accounted for a quarter of the world's. In the textile industry, yarn defect detection has a major impact on the production quality of textiles. At present, automatic detection of yarn defects is playing an increasingly important role in production. [0003] At present, there are many technical solutions for photoelectric detection of yarn defects. For example, Zhao Xiaodong et al. used capacitive probes to detect yarn thickness and flat defects in "Design of Capacitive Electronic Yarn Clearing System"; Jia Konghao et al. used COMS sen...

AI Technical Summary

Problems solved by technology

[0004] In order to overcome the shortcomings of the existing technical solutions, such as high implementation cost, complex circuit system, and the detection of flat yarn defects that are easily affected by the environment, the present invention provides a low-cost, simple system that can simultaneously detect yarn thickness defects and flat defects. The dual light source detection method

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