Powder X-ray diffraction method for measuring cell parameters of ZSM-23 molecular sieve

A ZSM-23, unit cell parameter technology, applied in the direction of material analysis using radiation diffraction, can solve the problem of not describing the details of the measurement, achieve the effect of simple calculation method and reduce errors

Inactive Publication Date: 2016-07-06
PETROCHINA CO LTD
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Problems solved by technology

Most of the ZSM-23 molecular sieves are synthesized or related catalytic research reports, but they usually only mention the determination in one sentence, and do not describe the specific determination details.

Method used

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  • Powder X-ray diffraction method for measuring cell parameters of ZSM-23 molecular sieve
  • Powder X-ray diffraction method for measuring cell parameters of ZSM-23 molecular sieve
  • Powder X-ray diffraction method for measuring cell parameters of ZSM-23 molecular sieve

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Embodiment Construction

[0036] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments, but not as a limitation of the present invention.

[0037] Such as figure 1 Shown is the flow chart of the powder X-ray diffraction method for measuring ZSM-23 molecular sieve unit cell parameters of the present invention. Specifically, the process includes:

[0038] Step 101, the ZSM-23 molecular sieve sample from which the template agent has been removed is ground, sieved, activated by roasting, and subjected to room temperature constant humidity water absorption treatment to obtain a ZSM-23 molecular sieve sample to be tested;

[0039] Step 102, under the same working conditions of the powder X-ray diffractometer, press the ZSM-23 molecular sieve sample to be tested and the optimized NIST mica standard sample into corresponding powder X-ray diffractometer sample holders respectively, and perform sample correction Measure and collect powder...

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Abstract

The invention discloses a powder X-ray diffraction method for measuring cell parameters of a ZSM-23 molecular sieve. The method includes the steps of: 1) performing grinding, sieving, roasting activation and room-temperature constant-moisture treatment to a ZSM-23 molecular sieve sample to obtain a ZSM-23 molecular sieve to-be-tested sample; 2) under the equal operation conditions of a powder X-ray diffraction instrument, respectively pressing the ZSM-23 molecular sieve to-be-tested sample and a NIST mica standard sample into corresponding sample frames in the powder X-ray diffraction instrument, and carrying out sample diffraction peak angle correction measurement and collecting powder X-ray diffraction data; and 3) when the diffraction peak angle is corrected with the NIST mica standard sample, calculating the cell parameters of the ZSM-23 molecular sieve sample according to an orthorhombic system interplanar crystal spacing formula.

Description

technical field [0001] The invention relates to a powder X-ray diffraction method for measuring molecular sieve unit cell parameters, in particular to a powder X-ray diffraction method for determining ZSM-23 molecular sieve unit cell parameters. Background technique [0002] Zeolite molecular sieves are widely used as catalysts or catalyst supports in the catalytic process of petrochemical industry. Unit cell parameters, relative crystallinity, silicon-aluminum ratio, purity, etc. are indispensable basic parameters to characterize the performance of molecular sieves. Therefore, it is very important to quickly and accurately determine the unit cell parameters of molecular sieves for designing the preparation process of molecular sieves and evaluating the performance of related catalysts. The powder X-ray diffraction method has the advantages of simple sample preparation, short measurement time, good repeatability, high reliability, and low cost. It is widely used in the dete...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/20
Inventor 李瑞峰王秀绘
Owner PETROCHINA CO LTD
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