Test fixture
A test fixture and test pin technology, which is used in semiconductor/solid-state device testing/measurement, electrical components, semiconductor/solid-state device manufacturing, etc., and can solve the problems of poor safety performance, complex structure, and inconvenient use of test fixtures. , to achieve the effect of improving equipment safety, simple structure and convenient operation
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[0016] The technical solution of this patent will be further described in detail below in conjunction with specific embodiments.
[0017] A test fixture, comprising a fixed frame 1, the two sides of the fixed frame 1 are connected to the lower pressure plate 3 through iron rods 2, the lower pressure plate 3 is made of insulating material, the lower part of the lower pressure plate 3 is provided with a plurality of lower pressure columns 4, and the middle part of the lower pressure plate 3 There is a lid-closing pressure rod 5, and the upper part of the lid-closing pressure rod 5 is provided with a quick clamping hand 6, which is used to adjust the height of the lower pressing plate 3. The upper part of the quick clamping hand 6 is provided with a pressure handle, and the lower pressing plate 3 is provided with a The high-voltage connection line 7 is provided with a high-voltage input terminal at the end of the high-voltage connection line 7. The lower part of the lower pressure...
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