Test fixture
A test fixture and test pin technology, which is used in semiconductor/solid-state device testing/measurement, electrical components, semiconductor/solid-state device manufacturing, etc., and can solve the problems of poor safety performance, complex structure, and inconvenient use of test fixtures. , to achieve the effect of improving equipment safety, simple structure and convenient operation
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[0016] The technical solution of the present patent will be described in further detail below in conjunction with specific embodiments.
[0017] A test fixture includes a fixing frame 1. Both sides of the fixing frame 1 are connected to a lower pressing plate 3 through iron rods 2. The lower pressing plate 3 is made of insulating material. There is a cover closing pressure rod 5, the upper part of the cover closing pressure rod 5 is provided with a quick clamp 6, the quick clamp 6 is used to adjust the height of the lower pressure plate 3, the upper part of the quick clamp 6 is provided with a pressure handle, and the lower pressure plate 3 is provided with The high-voltage connecting line 7 has a high-voltage input end at the end of the high-voltage connecting line 7, and the lower part of the lower pressing plate 3 is a test board 8. The test board 8 is evenly provided with several test pin groups. The test pin group includes two test pins 9, several The shape formed by each...
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