System for measuring sample photoluminescence under deep low temperature and intense magnetic field
A technology of strong magnetic field and sample light, applied in the direction of material excitation analysis, etc., can solve the problems of difficult sample corrosion, sample damage, and sample electrode preparation, etc., and achieve the effect of no sample size requirement, high resolution, and simple and convenient method.
Active Publication Date: 2016-08-31
SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
View PDF9 Cites 0 Cited by
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
[0003] At present, most of these studies use traditional electrical testing methods, so they are limited by the conductivity of the material substrate, the carriers in the three-dimensional direction, the sample is not easy to corrode and may destroy the sample, and the sample electrode is not easy to prepare.
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View moreImage
Smart Image Click on the blue labels to locate them in the text.
Smart ImageViewing Examples
Examples
Experimental program
Comparison scheme
Effect test
Embodiment Construction
[0016] A better example of the present invention is given below according to the content of the invention and the accompanying drawings, and the technical details, structural features and functional characteristics of the present invention are further described in conjunction with the examples. However, this example does not limit the scope of the present invention, and the examples described in the summary of the invention and the description of the drawings should be included in the scope of the present invention.
[0017] The fiber laser 101 is a 532nm fiber laser, model LSR532H-600.
[0018] Optical fiber assembly A102 and optical fiber assembly B110 use silica optical fiber, product model UV600-1*2. The optical fiber I103 and the optical fiber II108 are quartz optical fibers with a core diameter of 1 mm. The outer part of the outer layer located in the magnetic transport sample chamber 109 has a 3 mm sheath. set.
[0019] The vacuum sealing joint 104 is made of stainles...
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More PUM
| Property | Measurement | Unit |
|---|---|---|
| diameter | aaaaa | aaaaa |
| diameter | aaaaa | aaaaa |
Login to View More
Abstract
The invention discloses a system for measuring sample photoluminescence under a deep low temperature and intense magnetic field. The measuring system is mainly composed of an optical fiber laser, optical fiber components, optical fibers, a vacuum sealing joint, an O-shaped ring, a nut, a sample to be measured, a magnetic conveying sample chamber, a spectrometer, a test and analysis computer and the like. The measuring system is mainly characterized in that photoluminescence testing is conducted on the sample in a deep low temperature and intense magnetic field environment by means of the optical fiber components, and combination of the photoluminescence testing and deep low temperature and intense magnetic field conveying measurement is achieved.
Description
technical field [0001] The invention relates to a photoluminescence measurement system, which creatively introduces photoluminescence measurement under extremely low temperature and strong magnetic field through optical fiber, to measure the structure, composition, information of environmental atomic arrangement of materials and minority current carrying of semiconductor materials It provides new methods such as sub-lifetime, which is simple, non-destructive, has no requirement for sample size, and has high resolution. Background technique [0002] Among the test methods related to semiconductor materials and devices, magnetic transport is an important and basic research method, which is used to study basic information such as carrier concentration, type and mobility of materials. Under the condition of deep low temperature, many quantum effects appear. As a correction to the classical conductance, the quantum effect of conductance reflects the physical information such as t...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More Application Information
Patent Timeline
Login to View More Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/63
CPCG01N21/63
Inventor 吕蒙俞国林林铁褚君浩
Owner SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI