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Simplified Sagnac interference element based on reflective blazed gratings

A technology of blazed gratings and interference elements, applied in the direction of optical devices, measuring devices, instruments, etc., can solve the problems that cannot limit or affect the imaging quality and range of remote sensing equipment, etc., and achieve low installation accuracy requirements, simple and compact overall structure, good interference effect

Inactive Publication Date: 2016-10-26
HEFEI UNIV OF TECH
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  • Description
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  • Application Information

AI Technical Summary

Problems solved by technology

[0005] However, the size of the light source will affect the imaging quality and range of remote sensing and other equipment, and it cannot be limited. The spectral width must meet the range of visible light, and cannot be further restricted; not publicly reported

Method used

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  • Simplified Sagnac interference element based on reflective blazed gratings
  • Simplified Sagnac interference element based on reflective blazed gratings
  • Simplified Sagnac interference element based on reflective blazed gratings

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Embodiment Construction

[0036] see figure 1 , the simplified Sagnac interference element based on the reflective blazed grating in this embodiment includes a polarization beam splitter 2, a first reflective blazed grating 1, a second reflective blazed grating 3, a polarizer 4, an imaging optical system 5 and an interference pattern receiving surface 6 each device; the structural form of setting the interference element is:

[0037] The parallel incident light beam A is split into two beams of linearly polarized light whose polarization directions are perpendicular to each other through the polarizing beam splitter 2, which are the first beam A11 formed by reflection and the second beam A12 formed by transmission; the first beam A11 passes through the first The reflective blazed grating 1 and the second reflective blazed grating 3 are reflected and incident on the polarizing beam splitter 2 along the direction opposite to the incident light beam, and projected through the polarizer 4 and the imaging o...

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Abstract

The present invention discloses a simplified Sagnac interference element based on reflective blazed gratings. The simplified Sagnac interference element based on the reflective blazed grating is characterized by comprising a polarizing beam splitter, the reflective blazed gratings, a polaroid, an imaging optical system and an interference pattern reception surface, wherein the parallel incident light beams are divided into P light and S light via the polarizing beam splitter; the P light goes ahead along a direction reverse with the incident light beams after being reflected by a first reflective blazed grating and a second reflective blazed grating orderly, is reflected by the polarizing beam splitter and then is orderly projected by the polaroid and the imaging optical system to the interference pattern reception surface; the S light is reflected by the second reflective blazed grating and the first reflective blazed grating, then is transmitted through the polarizing beam splitter, the polaroid and the imaging optical system along a direction vertical with the incident light beams and then is projected to the interference pattern reception surface; and the interference element obtains the interference patterns on the interference pattern reception surface aiming at the parallel incident light beams. According to the present invention, the requirements of a white light polarized interferometer can be satisfied.

Description

technical field [0001] The invention relates to a simplified Sagnac interference element based on a reflective blazed grating. Background technique [0002] An interferometer is an instrument made according to the principle of light interference. Different light beams from the same light source go through different optical paths and then combine to show interference fringes. It plays an important role in spectroscopy, microbiology, analytical chemistry, physics, remote sensing science, medicine, military science, precision machinery, precision measurement and precision control. Reflection, refraction, and diffraction are mostly used in the optical path of the interferometer to realize the separation, deflection, and convergence of light. [0003] Since interferometer measurement is based on interference fringes, the visibility of interference fringes is very important to interferometers; in traditional interferometers, the main factors affecting the visibility of interfere...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B9/02
CPCG01B9/02017G01B9/02049
Inventor 金施群邢金玉严成宸闫真真侯少阳
Owner HEFEI UNIV OF TECH
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