The invention provides an anti-counterfeiting film. Anti-counterfeiting pattern layers of the anti-counterfeiting film comprise hollowed out refractive material parts; each hollowed out refractive material part comprises at least one film stack with a film structure of |(alpha<1> H beta<1> L alpha<2> H beta<2> L...alpha<m> H beta<m> L)|, wherein H is used for representing a high refractive index layer, L is used for representing a low refractive index, n and m are positive integers, 3<n<=150, 3<m<=50, m<=n, in a same film stack, alpha<1>, alpha<2>, ..., alpha<m> and beta<m>, ..., beta <2>, andbeta <1> are capable of satisfying a same grading change rule of a same cosine wave or sinusoidal wave pattern independently, according to the i th high and low refractive index units alpha H beta L, alpha is used for representing the optical thickness of the i th high refractive index material layer accounts for alpha times of lambda/4; and beta is used for representing the optical thickness of the i th low refractive index material layer accounts for beta times of lambda/4, lambda is used for representing monitoring wavelength, and the reflection wavelength of the anti-counterfeiting film ranges from 380 to 700nm. Low cost counterfeiting is achieved.