Unlock instant, AI-driven research and patent intelligence for your innovation.

A Photodetector Containing Buried Oxygen Layer Structure

A technology of photodetector and buried oxide layer, applied in the field of photodetector, can solve the problem of large surface roughness of Ge thin film, and achieve the effect of strengthening absorption

Inactive Publication Date: 2017-09-22
UNIV OF ELECTRONICS SCI & TECH OF CHINA
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, a buffer layer material of several microns is usually required, resulting in a relatively large surface roughness of the Ge film.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A Photodetector Containing Buried Oxygen Layer Structure
  • A Photodetector Containing Buried Oxygen Layer Structure

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0038] The present invention will be further elaborated below in conjunction with the accompanying drawings and specific embodiments.

[0039] have to be aware of is, figure 1 and figure 2 Only a schematic simplified view of the diode is represented, the two figures are therefore not drawn to scale.

[0040] Such as figure 2 Shown is a structural diagram of a photodetector with a buried oxide layer structure provided by the present invention. The photodiode consists of a Ge PIN photodiode composed of a heavily doped P-type Ge layer 7, a heavily doped N-type Si layer 4 containing a buried oxide layer 5, and an intrinsic Ge layer 6 doped in the middle. A Si PIN type photodiode composed of the heavily doped N-type Si layer 4 of the oxygen layer 5, the heavily doped P-type Si layer 2, and the intrinsic Si layer 3 doped in the middle passes through the heavily doped N-type Si layer containing the buried oxygen layer 5. Type Si layers 4 are connected back to back. The lateral...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to the field of semiconductor devices, in particular to a photodetector with a buried oxygen layer structure, which can detect visible light to infrared light. Among them, the Ge PIN photodiode and the Si PIN photodiode are connected back to back through the heavily doped N-type Si layer containing the buried oxide layer, and the Si PIN photodiode and the Ge PIN photodiode have relatively high responses to short and long wavelengths, respectively. Features, realize the detection of visible light to infrared light band; the passivation layer not only has the function of passivating the device, but also has the function of reducing short-wave reflection; the buried oxide layer and the N-type silicon layer form a Bragg reflector, which can reflect light in the band around 0.85μm Short-wave photons, strengthen the absorption of Si PIN photodiodes to short-waves in the band around 0.85 μm; the first metal anode contact acts as an electrode and a metal mirror at the same time, playing the role of applying voltage and reflecting long-wave photons, and strengthening Ge PIN photodiodes to long-wave photons absorption; and the photodiode involved in the present invention has a low working voltage, and is easy to mix and integrate with the preamplifier.

Description

technical field [0001] The invention relates to the field of semiconductor devices, in particular to a photodetector with a buried oxide layer structure. Background technique [0002] Photodetectors are essential key components in optical fiber communication systems. Short-distance, high-density optical fiber communication systems and data transmission systems in the 0.8μm-0.9μm band often use Si single crystal substrates or GaAs-based PIN photodetectors and avalanche photodetectors for detection. The 1.06μm-1.55μm band optical fiber communication network is usually detected by Ge single crystal substrate or InP-based PIN photodetector or avalanche photodetector. [0003] As one of the important branches, silicon photodiodes are widely used in the field of visible light detection and imaging because of their good spectral response, low noise, long life and high compatibility with CMOS processes. Among them, silicon photodiodes, as one of the most commonly used photodetecto...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H01L31/105H01L31/101H01L31/0352H01L31/0232
CPCH01L31/0232H01L31/02327H01L31/0352H01L31/101H01L31/105
Inventor 张有润钟晓康刘影李明晔刘凯胡刚毅张波
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA