Multifunctional spectrum emissivity measurement apparatus and measurement method thereof

Abstract

The invention discloses a multifunctional spectrum emissivity measurement apparatus and a measurement method thereof. An elliptical reflector B is arranged right above an aperture center of a standard blackbody, a mirror surface center position of the elliptical reflector B is fixedly connected with a rotating shaft of a stepping motor B through an elliptical arm B, an elliptical reflector A is arranged right above a surface center of a sample, a mirror surface center position of the elliptical reflector A is connected with the top portion of an elliptical arm A, the bottom of the elliptical arm A is fixedly connected with a rotating shaft of a stepping motor A, one side of an electric adjustable reflector is provided with a parabolic reflector used for reflecting radiation energy reflected by the electric adjustable reflector, and one side of the parabolic reflector is provided with a detection apparatus used for receiving the radiation energy reflected by the parabolic reflector. The invention also discloses a measurement method of the multifunctional spectrum emissivity measurement apparatus. According to the invention, the spectrum emissivity of a material is measured by use of two different measurement methods through one apparatus, and through comparison, the accuracy of measurement data can be improved.

Description

technical field [0001] The invention belongs to the technical field of measuring devices for thermal physical properties of materials, and in particular relates to a multifunctional spectral emissivity measuring device and a measuring method thereof. Background technique [0002] The spectral emissivity of a material is a physical quantity that characterizes the infrared radiation ability of the material surface. It is an important thermophysical parameter and has important application value in the fields of radiation temperature measurement, infrared guidance and infrared heating. In recent years, with the rapid development of modern science and technology, new challenges have been posed to the measurement of spectral emissivity of materials. In many technical fields of spectral emissivity applications, such as photovoltaic materials, missile skins, and satellite remote sensing, accurate measurement is required. Spectral emissivity data. Therefore, it is of great practical...

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Problems solved by technology

At present, most of the measuring devices can only measure a certain spectral emissivity through one method, which has a single function, and most of the measurements are the normal spectral emissivity of the material, and it is relatively easy to measure the spectral emissivity in the direction of continuous angles. few

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