Multifunctional spectrum emissivity measurement apparatus and measurement method thereof

A spectral emissivity and measurement device technology, applied in the field of multifunctional spectral emissivity measurement devices, can solve the problems of single function and low spectral emissivity, and achieve the effects of improving accuracy, simple structure, and avoiding difficulties in optical path alignment

Active Publication Date: 2017-02-15
HENAN NORMAL UNIV
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Problems solved by technology

At present, most of the measuring devices can only measure a certain spectral emissivity through one method, which has a single function, and most of the measurements are the normal spectral emissivity of the material, and it is relatively easy to measure the spectral emissivity in the direction of continuous angles. few

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  • Multifunctional spectrum emissivity measurement apparatus and measurement method thereof

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Embodiment Construction

[0017] The specific content of the present invention will be described in detail in conjunction with the accompanying drawings. Multifunctional spectral emissivity measurement device, including stepper motor A1, stepper motor B2, elliptical arm A3, elliptical arm B, elliptical reflector A4, elliptical reflector B5, electric adjustable reflector 6, parabolic reflector 7, flat plate Sample heater 8, standard blackbody furnace 9, detection device 10 and control device 11, wherein the surface center of the sample in the flat panel sample heater 8, the aperture center of the standard blackbody in the standard blackbody furnace 9, and the mirror surface center of the electric adjustable mirror 6 On the same horizontal plane and the distance between them is equal in pairs, there is an elliptical reflection consistent with the outer wall of the ellipsoid with the center of the aperture of the standard blackbody and the mirror center of the electric adjustable mirror 6 as the focus, jus...

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Abstract

The invention discloses a multifunctional spectrum emissivity measurement apparatus and a measurement method thereof. An elliptical reflector B is arranged right above an aperture center of a standard blackbody, a mirror surface center position of the elliptical reflector B is fixedly connected with a rotating shaft of a stepping motor B through an elliptical arm B, an elliptical reflector A is arranged right above a surface center of a sample, a mirror surface center position of the elliptical reflector A is connected with the top portion of an elliptical arm A, the bottom of the elliptical arm A is fixedly connected with a rotating shaft of a stepping motor A, one side of an electric adjustable reflector is provided with a parabolic reflector used for reflecting radiation energy reflected by the electric adjustable reflector, and one side of the parabolic reflector is provided with a detection apparatus used for receiving the radiation energy reflected by the parabolic reflector. The invention also discloses a measurement method of the multifunctional spectrum emissivity measurement apparatus. According to the invention, the spectrum emissivity of a material is measured by use of two different measurement methods through one apparatus, and through comparison, the accuracy of measurement data can be improved.

Description

technical field [0001] The invention belongs to the technical field of measuring devices for thermal physical properties of materials, and in particular relates to a multifunctional spectral emissivity measuring device and a measuring method thereof. Background technique [0002] The spectral emissivity of a material is a physical quantity that characterizes the infrared radiation ability of the material surface. It is an important thermophysical parameter and has important application value in the fields of radiation temperature measurement, infrared guidance and infrared heating. In recent years, with the rapid development of modern science and technology, new challenges have been posed to the measurement of spectral emissivity of materials. In many technical fields of spectral emissivity applications, such as photovoltaic materials, missile skins, and satellite remote sensing, accurate measurement is required. Spectral emissivity data. Therefore, it is of great practical...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J5/00
CPCG01J5/0003
Inventor 于坤刘栋刘玉芳李龙飞张飞麟张凯华
Owner HENAN NORMAL UNIV
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