IO performance test method and apparatus of SAN storage device
A technology of storage equipment and testing methods, applied in digital transmission systems, electrical components, transmission systems, etc., capable of solving problems such as differences
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Embodiment 1
[0039] Embodiment one: the IO performance testing device of a kind of SAN storage device of the present invention is as figure 1 As shown, it includes a LUN creation module 13 , a test tool installation module 14 , a load generator configuration module 15 , a RAID reconstruction module 11 and a storage pool creation module 12 . The RAID reconstruction module 11 is sequentially connected with the storage pool creation module 12 , the LUN creation module 13 , the test tool installation module 14 , and the load generator configuration module 15 .
[0040] The LUN creation module 13 is used to create multiple LUNs on the storage device and mount them on multiple test clients respectively; the test tool installation module 14 is used to install the IO performance test tool on the control client and install the load generator on the test client The load generator configuration module 15 is used to control the client computer to configure the load generator by the IO performance test...
Embodiment 2
[0041] Embodiment two: the IO performance test method of a kind of SAN storage device of the present invention is as figure 2 shown, including the following steps:
[0042] Step S201, release the storage space of the storage device to be tested.
[0043] Step S202, re-creating the disk array RAID, covering all RAID levels according to the types supported by the storage device, such as creating several RAID 0, RAID 1, RAID 5, RAID 6 and RAID 10, ensuring that the available sizes of these RAIDs are not much different.
[0044] In step S203, a storage pool is created, and the created RAID is added to the storage pool to form an abstraction layer that can be used to create LUNs.
[0045]Step S204, create more than 10 LUNs in the storage pool. In this example, create 20 LUNs, and ensure that the size of these LUNs is two to five times the size of the storage device cache. The purpose is to reduce the impact of the cache on the actual performance of the disk during the test. infl...
Embodiment 3
[0053] Embodiment 3: Another IO performance test device of the SAN storage device of the present invention is as follows image 3 As shown, it includes a LUN creation module 31 , a test tool installation module 32 and a load generator configuration module 33 . Wherein the LUN creation module 31 is sequentially connected with the test tool installation module 32 and the load generator configuration module 33 .
[0054] The LUN creation module 31 is used to create multiple LUNs on the storage device and mount them on multiple test clients respectively; the test tool installation module 32 is used to install the IO performance test tool on the control client and install the load generator on the test client ; The load generator configuration module 33 is used to control the client to configure the load generator through the IO performance testing tool, and the load generator executes corresponding IO operations.
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