Spatial resolution test system

Abstract

The embodiment of the invention provides a spatial resolution test system. The system comprises: an X ray machine used for emitting X rays for CT spatial resolution test; a detection standard part, wherein the detection standard part comprises a standard part body, and test portions and isolation portions which are periodically arranged on the standard part body, and the test portions comprise lug bosses and grooves; and a detector, wherein X rays which pass through the lug bosses and the grooves of the test standard part are received by the detector and are converted into an electric signal, the electric signal is converted into a visual gray scale image, the edge of the gray scale image has concave and convex characteristic, the size of the concave and convex characteristic gradually reduces with the gradual reduction of the size of line pairs, and the quantity of the line pairs in a unit when the concave and convex characteristic points are reduced, the size of the concave and convex features is gradually reduced, and the number of lines in the per unit length of 1 MM is the corresponding spatial resolution when a difference between the low value and the high value of the gray values of the concave and convex characteristic points reaches a first threshold. The spatial resolution test system reduces the processing difficulty and the processing cost, reduces the detection time cost, and has a high detection precision.

Description

technical field [0001] The invention relates to a test system for spatial resolution, in particular to a test system for CT spatial resolution. Background technique [0002] At present, the spatial resolution of CT usually uses a line-to-card, but the line-to-card must be placed perpendicular to the direction of X-ray emission, otherwise the tilt of the placement will lead to inaccurate testing of the spatial resolution of CT. Secondly, the iron wire of the test standard part in the wire pair card is very thin, and there will be restrictions on processing and placing it side by side. Contents of the invention [0003] The object of the present invention is to provide a spatial resolution test system for the defects of the prior art, thereby utilizing the test part that changes periodically on the test standard part to detect the spatial resolution, reduce processing difficulty and cost, and reduce detection time and cost , the detection accuracy is higher. [0004] In or...

AI Technical Summary

Problems solved by technology

[0002] At present, the spatial resolution of CT usually uses a line-to-card, but the line-to-card must be placed perpendicular to the direction of X-ray emission, otherwise the tilt will lead to inaccurate testing of the spatial resolution of CT.

Secondly, the iron wire of the test standard part in the line pair card is very thin, and there will be restrictions on processing and placing it side by side.

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