A device and method for measuring sub-pixel temperature distribution based on multi-spectral measurement

Abstract

The present invention relates to a sub-pixel temperature distribution measurement device and method based on multispectral survey. The device comprises a multispectral survey device facing points to be measured and a radiation source; the multispectral survey device is configured to measure the first radiation intensity of the points to be measured in different wavelengths in the state of the closing of the radiation source and measure the second radiation intensity of the points to be measured in different wavelengths in the state of the opening of the radiation source; the second radiation intensity is the sum of the radiation intensity emitted by the radiation source and reflected by the points to be measured and the radiation intensity of the points to be measured; and the sub-pixel temperature distribution of the points to be measured is determined according to the first radiation intensity, the second radiation intensity and the radiation intensity of the radiation source in different wavelengths. According to the technical scheme of the invention, the sub-pixel temperature distribution measurement device and method based on multispectral survey can rapidly determine the sub-pixel temperature distribution in the areas of the points to be measured to realize the non-contact online measurement of the radiation temperature in the unknown emissivity, and can be applied to large-temperature gradient, high transient response and long-term continuous measurement.

Description

technical field [0001] The invention relates to the field of radiation temperature measurement, in particular to a sub-pixel temperature distribution measurement device and method based on multispectral measurement. Background technique [0002] In the fields of energy power, petrochemical industry, aerospace and other fields, radiation thermometry instruments have a wide range of application requirements, such as temperature measurement and control inside the furnace of power plants, combustion temperature diagnosis of internal combustion engines, surface temperature measurement of ablation materials, structural tests in thermal environment tests Part temperature distribution measurement, etc. Compared with traditional contact temperature measurement methods such as thermocouples and thermal resistances, the non-contact radiation temperature measurement technology based on spectral remote sensing has technical advantages such as wide temperature measurement range, fast resp...

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Problems solved by technology

[0003] Radiation temperature measurement methods and technologies have been developed and applied in many fields, but in high-speed rotating blade temperature test, structural thermal test temperature test and other temperature tests with high parameters, large temperature gradient, high transient response, and long-term continuous measurement characteristics In measurement applications, the existing radiation temperature test methods still have some difficulties and technical limitations:

[0004] (1) Point measurement radiation temperature measurement technology: it can realize high-speed measurement of point area temperature; however, point temperature measurement technology needs to use mechanical scanning to measure the temperature field of the entire area, which is difficult to apply to the measurement and diagnosis of high transient temperature field

[0005] (2) Radiation temperature field test technology: using surface imaging sensors, the low-frequency system cannot meet the measurement requirements of high transient response, while the high-frequency system has a huge data flow, which makes it difficult to measure for a long time; and due to the dynamics of the imaging sensor The range is limited. When the measurement target has a large temperature gradient distribution, it is difficult to measure the temperature field of the entire area in one measurement.

[0006] (3) Whether it is for point measurement or field measurement technology, the accuracy of radiation temperature measurement strongly depends on emissivity data or emissivity assumption model, and spectral emissivity is complexly related to material composition, surface state, temperature, wavelength and other factors , the accurate measurement of emissivity has always been a difficult problem in the field of metrology. The unknown and uncertain emissivity is the key obstacle to the accurate measurement of radiation temperature. This is a difficult problem that most radiation temperature measurements cannot avoid.

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