Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A Color Image Enhancement Method for Metrology Microscope

A color image and microscope technology, which is applied in image enhancement, image data processing, calculation, etc., can solve the problems of color image distortion and other problems, and achieve the effect of increasing saturation, eliminating edge blur and halo phenomenon, and suppressing whitening

Active Publication Date: 2019-08-23
刘俭 +2
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The purpose of the invention is to solve the problem that the color distortion of the color image will be caused when the traditional enhancement technology is used to enhance the color image. The invention provides a color image enhancement method for a metrology microscope

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A Color Image Enhancement Method for Metrology Microscope
  • A Color Image Enhancement Method for Metrology Microscope
  • A Color Image Enhancement Method for Metrology Microscope

Examples

Experimental program
Comparison scheme
Effect test

specific Embodiment approach 1

[0038] Specific embodiment one: a color image enhancement method of a metrology microscope described in this embodiment, the method includes the following steps:

[0039] Step 1: Convert the RGB image collected by the biological microscope to the HIS space, and obtain the three components of the image in the HIS space, which are the original chromaticity component H(x,y), the original brightness component I(x,y) and the original Saturation component S(x, y); wherein, (x, y) represents the coordinates of the pixel point;

[0040] Step 2: use the Retinex algorithm to process the original luminance component I(x, y) to obtain the processed luminance component r(x, y), and then perform local contrast enhancement on the processed luminance component r(x, y), Obtain new brightness component I' (x, y); The value of scale parameter c in the described Retinex algorithm is 15, 80 or 250;

[0041] Step 3: Perform adaptive saturation compensation on the original saturation component S(x,...

specific Embodiment approach 2

[0045] Specific embodiment two: the difference between this embodiment and the color image enhancement method of a metrology microscope described in specific embodiment one is that the surround function expression of the Retinex algorithm is:

[0046] Among them, F(x,y) represents the Gaussian convolution kernel function, k represents the coefficient, and e represents the natural exponent.

specific Embodiment approach 3

[0047] Specific Embodiment 3: The difference between this embodiment and the color image enhancement method of a metrology microscope described in Embodiment 1 or 2 is that in step 2, the processed brightness component r(x, y) The specific process of performing local contrast enhancement to obtain a new brightness component I′(x,y) is:

[0048] Step 21, using the following formulas 1 and 2 to obtain the local details re(x,y) of the brightness component,

[0049]re(x,y)=r(x,y)-ravg(x,y) (Formula 1),

[0050] ravg(x,y)=F(x,y)*r(x,y) (Formula 2),

[0051] Step 22, perform gamma transformation on the obtained local details re(x, y) of the brightness component to obtain rn(x, y), where,

[0052] rn(x,y)=sign(re(x,y))|re(x,y)| r (Formula 3),

[0053] Step two and three, add rn(x, y) and r(x, y), and then convert to the real number domain, so as to obtain a new brightness component I'(x, y);

[0054] Among them, rn(x, y) is the local detail obtained after gamma transformation o...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A color image enhancement method for a metrological microscope belongs to the fields of optical microscopy technology and metrological testing technology. It solves the problem of color distortion caused by using traditional enhancement technology to enhance color images. The present invention uses the Retinex algorithm to directly transform the image into the HSI space. Then the image can be converted from the RGB color space to the HIS color space, keeping the original chroma component H(x,y) unchanged and changing the original brightness component I(x,y ) and the original saturation component S(x,y). Then the image is converted to RGB space through inverse operation, which can save a lot of calculation time. Since the original chroma component H(x,y) is not changed, the final hue of the image should remain unchanged without causing color distortion. The invention is mainly used for processing color images.

Description

technical field [0001] The invention belongs to the technical field of optical microscopic technology and measurement test. Background technique [0002] The current process of image processing is to add one-dimensional color information on the basis of the three-dimensional height information of the sample measured by the confocal microscope to form a four-dimensional information map that can directly reflect the material and shape of the sample. The three-dimensional height information can be obtained by the confocal microscope. The measured tomographic data is processed to get more accurate results, and the color information of each position of the sample is obtained by taking pictures of the color CCD, but the brightness and contrast of the pictures obtained by taking the color CCD are not high, and the color is very dim, so As a result, the recognizability of the color picture is not good, and the display effect of directly adding the color information to the three-dime...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G06T5/00
CPCG06T5/94G06T5/73
Inventor 刘俭谭久彬李勇牛斌
Owner 刘俭
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com