TE die polarization analyzer based on symmetrical three-waveguide directional coupler structure

A directional coupler and waveguide technology, applied in the field of integrated optics, can solve the problems of high ohmic loss and high insertion loss that are not conducive to large-scale production and cost, and achieve the effects of compact structure, low insertion loss, and reduced insertion loss
CN106959163AActive Publication Date: 2017-07-18SOUTHEAST UNIV
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Patent Information

Authority / Receiving Office
CN ยท China
Patent Type
Applications(China)
Current Assignee / Owner
SOUTHEAST UNIV
Publication Date
2017-07-18

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Abstract

The invention discloses a TE die polarization analyzer based on a symmetrical three-waveguide directional coupler structure; the polarization analyzer comprises a silicon-based substrate (9), a buried oxide (10), a polarization analyzing part (15) and an upper cladding (11) arranged from bottom to top; the buried oxide (10) grows on the top surface of the silicon-based substrate (9); the upper cladding (11) covers the top surface of the buried oxide (10); the polarization analyzing part (15) horizontally grows on the top surface of the buried oxide (10), and is covered by the upper cladding (11); the polarization analyzing part (15) comprises an input channel (1), a middle path direct through channel (2), a left path direct through channel (4), a left path C-type bending channel (5), a right path direct through channel (6), a right path C-type bending channel (7) and an output channel (3); the TE die polarization analyzer is low in insertion loss, high in extinction ratio, large in work bandwidth, and compact in structure.
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Description

technical field

[0001] The invention relates to a TE mode polarizer based on a symmetrical three-waveguide directional coupler structure, belonging to the technical field of integrated optics. Background technique

[0002] Recently, silicon-on-insulator (SOI) material systems have attracted much attention as fabrication platforms for integrated photonic circuits (PICs). However, the refractive index difference between the cladding layer and the core layer in SOI materials is large, which is prone to polarization-related problems, including polarization mode dispersion and polarization-dependent gain. A simple and effective solution is to use a mode analyzer to eliminate unwanted polarized light. Generally, there are two types of mode analyzers, TE and TM analyzers. Among them, the TE analyzer can pass the TE polarized light and block the TM polarized light. At present, mode analyzers based on different principles and using different structures have been reported successiv...

Claims

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