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TE die polarization analyzer based on symmetrical three-waveguide directional coupler structure

A directional coupler and waveguide technology, applied in the field of integrated optics, can solve the problems of high ohmic loss and high insertion loss that are not conducive to large-scale production and cost, and achieve the effects of compact structure, low insertion loss, and reduced insertion loss

Active Publication Date: 2017-07-18
SOUTHEAST UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, since the introduction of metal materials also brings high ohmic loss, the insertion loss of the mode analyzer based on the single structure of the hybrid plasmonic waveguide is generally high, which is not conducive to the application of this device in high-performance photonic circuits.
In addition, in order to reduce ohmic loss, some polarizers with complex structures are designed
These structures put forward very high requirements for device manufacturing, which is not conducive to large-scale production and cost reduction

Method used

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  • TE die polarization analyzer based on symmetrical three-waveguide directional coupler structure
  • TE die polarization analyzer based on symmetrical three-waveguide directional coupler structure
  • TE die polarization analyzer based on symmetrical three-waveguide directional coupler structure

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0038] Such as figure 1 with figure 2 As shown, the analyzer consists of a silicon-based substrate 9, a buried oxide layer 10, an analyzer component 15, and an upper cladding layer 11 from bottom to top, wherein the buried oxide layer 10 is grown on the upper surface of the silicon-based substrate 9, and the upper cladding layer 11 is The cladding layer 11 covers the upper surface of the buried oxide layer 10, and the analyzer component 15 grows horizontally on the upper surface of the buried oxide layer 10 and is covered by the upper cladding layer 11;

[0039] The polarization analysis unit 15 includes an input channel 1, a middle straight channel 2, a left straight channel 4, a left C-shaped curved channel 5, a right straight channel 6, a right C-shaped curved channel 7, and an output channel 3;

[0040] One end of the middle direct channel 2 is connected to the input channel 1, and the other end is connected to the output channel 3 to form a middle channel;

[0041] The...

Embodiment 2

[0055] Such as Figure 9 As shown in the schematic structural diagram of the improved polarization analyzer 15 (silicon-based substrate 9, buried oxide layer 10, and upper cladding layer 11 are identical to those of Embodiment 1), the improved polarization analyzer 15 includes an input channel 1, a middle through channel 2. Left straight channel 4, left C-shaped curved channel 5, right straight channel 6, right C-shaped curved channel 7, output channel 3;

[0056] One end of the middle direct channel 2 is connected to the input channel 1, and the other end is connected to the output channel 3 to form a middle channel;

[0057] The left straight-through channel 4 is connected to the left C-shaped curved channel 5, and the right straight-through channel 6 is connected to the right C-shaped curved channel 7; wherein, the output channel 3, the left C-shaped curved channel 5, and the right C-shaped curved channel 7 at the same end;

[0058] The left through channel 4 and the righ...

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PUM

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Abstract

The invention discloses a TE die polarization analyzer based on a symmetrical three-waveguide directional coupler structure; the polarization analyzer comprises a silicon-based substrate (9), a buried oxide (10), a polarization analyzing part (15) and an upper cladding (11) arranged from bottom to top; the buried oxide (10) grows on the top surface of the silicon-based substrate (9); the upper cladding (11) covers the top surface of the buried oxide (10); the polarization analyzing part (15) horizontally grows on the top surface of the buried oxide (10), and is covered by the upper cladding (11); the polarization analyzing part (15) comprises an input channel (1), a middle path direct through channel (2), a left path direct through channel (4), a left path C-type bending channel (5), a right path direct through channel (6), a right path C-type bending channel (7) and an output channel (3); the TE die polarization analyzer is low in insertion loss, high in extinction ratio, large in work bandwidth, and compact in structure.

Description

technical field [0001] The invention relates to a TE mode polarizer based on a symmetrical three-waveguide directional coupler structure, belonging to the technical field of integrated optics. Background technique [0002] Recently, silicon-on-insulator (SOI) material systems have attracted much attention as fabrication platforms for integrated photonic circuits (PICs). However, the refractive index difference between the cladding layer and the core layer in SOI materials is large, which is prone to polarization-related problems, including polarization mode dispersion and polarization-dependent gain. A simple and effective solution is to use a mode analyzer to eliminate unwanted polarized light. Generally, there are two types of mode analyzers, TE and TM analyzers. Among them, the TE analyzer can pass the TE polarized light and block the TM polarized light. At present, mode analyzers based on different principles and using different structures have been reported successiv...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J4/00
CPCG01J4/00
Inventor 肖金标倪斌
Owner SOUTHEAST UNIV
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