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Point light source ectopic Mach-Zehnder interferometer measurement device and method

A measurement device and point light source technology, applied in the direction of measurement devices, optical radiation measurement, measurement optics, etc., can solve the problems of difficulty in making polarization phase-shifting acquisition modules, high cost of instruments, complex structure, etc., and achieve easy test implementation and test process Simple, easy-to-adjust effects

Inactive Publication Date: 2017-09-01
NANJING UNIV OF SCI & TECH
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Problems solved by technology

However, the fabrication of the polarization phase-shifting acquisition module is relatively difficult and costly, and the structure is complex, resulting in high instrument cost

Method used

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  • Point light source ectopic Mach-Zehnder interferometer measurement device and method
  • Point light source ectopic Mach-Zehnder interferometer measurement device and method
  • Point light source ectopic Mach-Zehnder interferometer measurement device and method

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Embodiment 1

[0055] The point light source dislocation type Mach-Zehnder interferometer measuring device of the present invention is used to measure the optical path structure of the refractive index change in the compressible airflow, such as figure 2 shown, including,

[0056] 1) The point light source 1 and its light splitting component 2 are used to generate four diverging spherical waves with the same complex amplitude but different spatial positions. The beam splitting assembly includes a first collimating objective lens 3 , a checkerboard grating 4 , a first converging objective lens 5 , and an aperture stop 6 . The point light source 1 produces multiple diffraction orders after passing through the first collimating objective lens 3 and the checkerboard grating 4, and after being converged by the converging objective lens 5, the aperture diaphragm 6 filters out the (±1, ±1) order four beams of the checkerboard grating 4 , and filter out other orders of diffracted light. The four ...

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Abstract

The invention discloses a point light source ectopic Mach-Zehnder interferometer measurement device and method. The device comprises a point light source, a light splitting assembly, a main interferometer and a light splitting imaging assembly. The method comprises steps that firstly, spherical waves are emitted by the point light source, and the point light source is copied by the light splitting assembly into four identical point light sources; secondly, through adjusting distances of the four point light sources on a collimation object lens focal plane of the main interferometer and on an optical axis, corresponding phase shift amount is introduced to interference of a reference plane and a test plane; lastly, four intelligible imaging phase shift interferograms are simultaneously acquired on one CCD through the light splitting assembly. The device and the method are advantaged in that low cost, good anti-vibration performance, good contrast and easy operation are realized, and the device can be applied to the air flow density change measurement field.

Description

technical field [0001] The invention belongs to the technical field of optical interference measuring instruments, in particular to a measuring device and method of a point light source dislocation type Mach-Zehnder interferometer. Background technique [0002] The Mach-Zehnder interferometer adopts the design of the optical path of the measured beam and the reference beam. Compared with the Tieman-type interferometer with no common optical path, the Mach-Zehnder interferometer basically has no light returning to the laser, which causes the laser to be different. Stabilizes noise, which is good for interferometry. At present, the Mach-Zehnder type synchronous phase-shifting interferometer mainly adopts the polarization interferometry technology. Compared with the time-phase-shifting interferometry technology, it can obtain multiple phase-shifting interferograms at the same time and at different spatial positions, effectively suppressing the The influence of time-varying fac...

Claims

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Application Information

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IPC IPC(8): G01J9/02
CPCG01J9/02G01J2009/0234G01J2009/0288
Inventor 陈磊丁煜朱文华韩志刚郑东晖郑权张瑞孙沁园乌拉雅图
Owner NANJING UNIV OF SCI & TECH
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