Method for measuring KHP (potassium hydrogen phthalate) content by turbidity compensation ultraviolet-visible spectrophotometry
A visible light and photometric technology, which is used in the field of potassium hydrogen phthalate concentration measurement in water and UV-Vis photometric determination of KHP content, can solve the problem of high cost of multi-spectral measurement, low compensation accuracy of dual-wavelength method, and single-wavelength measurement. problems such as large errors, to achieve the effect of good repeatability, reducing influence and improving measurement accuracy
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0029] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.
[0030] The present invention uses the double light source ultraviolet-visible photometer of central wavelength 255nm ultraviolet light and central wavelength 532nm green light to measure the mixed solution of KHP standard solution and turbidity standard solution, and its total absorbance to ultraviolet light is equal to turbid liquid and KHP respectively to ultraviolet The sum of the absorbance contributions of light, where the green light source is used to compensate for turbidity. The outgoing light after passing through the solution is detected by two Si photodetectors, and the light signal is converted into an electrical signal, and then a narrow-band filter and an autocorrelation detection method are used to obtain the absorbance of the sample solution for ultraviolet light and green light. The absorbance of KHP solution to ultra...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com