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Worst-case eye diagram realization method based on pdn and channel coordination model

A channel and eye diagram technology, applied in the field of electronics, can solve problems such as large errors in evaluating link performance, deviation of simulation results from link noise, and inability to guide high-speed circuit design, achieving good overall performance and guiding design effects.

Active Publication Date: 2020-06-16
XIDIAN UNIV
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Problems solved by technology

[0005] The disadvantage of this method is that only the noise of the channel is considered and the influence of the power distribution network on the eye diagram is ignored, which makes the simulation results deviate from the real and objective link noise situation, and there will be a large error in evaluating the link performance. , cannot guide the design of high-speed circuits

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  • Worst-case eye diagram realization method based on pdn and channel coordination model
  • Worst-case eye diagram realization method based on pdn and channel coordination model
  • Worst-case eye diagram realization method based on pdn and channel coordination model

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Embodiment Construction

[0050] The present invention will be described in detail below in conjunction with the accompanying drawings.

[0051] refer to figure 1 , the implementation steps of the present invention are as follows:

[0052] Step 1, acquisition and processing of the worst power supply noise.

[0053] 1a) Build an active full-link model including the power distribution network PDN;

[0054] In order to simulate pure simultaneous switching noise SSN, several simultaneous switching noise SSN data lines without crosstalk coupling between each other are established, and a simultaneous switching noise SSN data line located in the physical center is selected as the victim line SSN_Vic of simultaneous switching noise, The other SSN data lines are used as the attack line SSN_Agg of the simultaneous switching noise, and the power supply noise coupled into the channel from the power distribution network PDN is obtained at the receiving end of the victim line SSN_Vic of the simultaneous switching ...

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Abstract

The invention discloses a worst eye pattern realizing method on the bases of PDN (peak distort analysis) and a channel coordination model, and aims to solve the problem that actual link performance cannot be evaluated accurately when power supply noise is not taken into consideration in the prior art. A scheme of the worst eye pattern realizing method includes: 1, simulating to obtain the worst power supply noise coupled into a channel; 2, partitioning the worst power supply noise to obtain a positive profile and a negative profile; 3, inputting an ascending edge and a descending edge in the front of a driver to obtain edge responses; 4, partitioning the edge responses by unit intervals, and combining the edge responses from damaged lines to obtain a start point of the channel noise; 5, processing the channel noise by a grid method so as to obtain a channel eye pattern; 6, overlaying the positive profile and the negative profile of the worst power supply noise onto the channel eye pattern to obtain an overall worst eye pattern of an active link. The obtained overall worst eye pattern of the active link can be applied to design and analysis of signal integrity in high-speed circuits and accurate evaluation of high-speed link performance.

Description

technical field [0001] The invention belongs to the field of electronic technology, and further relates to a method for realizing the worst eye diagram, which can be applied to the design analysis of signal integrity in high-speed circuits and the evaluation of high-speed link performance. Background technique [0002] With the development of electronic systems towards high speed, high density, low voltage and high current, power integrity issues have become increasingly prominent. In actual industrial manufacturing, engineers often use eye diagrams to measure whether the design meets the requirements. For high-speed links, if you can know whether the link interconnection can work normally in the worst case, you can improve the convergence and greatly The development cycle is shortened, so the worst eye diagram emerges as the times require, and the worst eye diagram is evolved from the traditional eye diagram. The traditional eye diagram is the result of cumulatively superi...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F30/20
CPCG06F30/20Y02E60/00
Inventor 初秀琴鱼鹏毛俊智石钱
Owner XIDIAN UNIV