Testing system and method of reflection parameters of building stress distribution

A technology for stress distribution and parameter testing, applied in the direction of measuring force, measuring device, instrument, etc.

Inactive Publication Date: 2017-12-12
XIAN UNIV OF SCI & TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, there is still a lack of systems and methods for conducting conduct

Method used

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  • Testing system and method of reflection parameters of building stress distribution
  • Testing system and method of reflection parameters of building stress distribution
  • Testing system and method of reflection parameters of building stress distribution

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Embodiment Construction

[0055] Such as figure 1 As shown, a building stress distribution reflecting parameter test system of the present invention includes a microcontroller module 1 and a computer 9 connected to the microcontroller module 1, as well as an excitation source 2 and uniformly arranged in the building area to be measured A plurality of electrodes 3; the input terminal of the microcontroller module 1 is connected with a data acquisition card 4, the input terminal of the data acquisition card 4 is connected with an amplifier 5, and the output terminal of the excitation source 2 is connected with a bipolar excitation Conversion circuit 6, described bipolar excitation conversion circuit 6 is connected with the output terminal of microcontroller module 1, and the output terminal of described microcontroller module 1 is also connected with excitation gating switch 7 and test gating switch 8, so The excitation strobe switch 7 is connected to the output end of the bipolar excitation conversion c...

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Abstract

The invention discloses a testing system of reflection parameters of building stress distribution. The testing system comprises a microcontroller module, a computer, an excitation source and a plurality of electrodes uniformly distributed in a to-be-measured area of a building, wherein an input end of the microcontroller module is connected with a data acquisition card; an input end of the data acquisition card is connected with an amplifier; an output end of the excitation source is connected with a bipolar excitation switching circuit; the bipolar excitation switching circuit is connected with an output end of the microcontroller module; the output end of the microcontroller module is also connected with an excitation gating switch and a test gating switch; the excitation gating switch is connected with an output end of the bipolar excitation switching circuit; the excitation gating switch and the test gating switch are both connected with the electrodes; an output end of the test gating switch is connected with an input end of the amplifier. The invention further discloses a testing method of the reflection parameters of architecture stress distribution. The system and the method are realized conveniently and are low in cost, the stress distribution of the building can be detected in a movable type in real time, and the detection efficiency is high, and the detection accuracy is high.

Description

technical field [0001] The invention belongs to the technical field of building stress distribution testing, and in particular relates to a testing system and method for reflecting parameter of building stress distribution. Background technique [0002] Electrical resistance tomography has the advantages of being non-invasive and radiation-free. Especially in modern industrial detection, geological exploration and other aspects have such a wide range of application prospects and advantages. Due to the uneven distribution of stress in the process of design and use of buildings, it will bring major safety hazards. Existing building stress testing products are costly, and testing devices need to be buried in buildings, which is inconvenient for mobile monitoring and popularization. For example, when the sound vibration and structural stress change sensors of reinforced concrete structures are used to detect the building stress distribution, the stress sensing unit needs to be...

Claims

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Application Information

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IPC IPC(8): G01L1/20
Inventor 赵栓峰王文波
Owner XIAN UNIV OF SCI & TECH
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