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A multi-sample solid insulation electrical life test system under small-capacity DC power supply

A DC power supply and solid insulation technology, applied in the high voltage field, can solve the problems of only a few microamperes, the fuse cannot be blown, and only tens of milliamperes, etc., to achieve small data dispersion, save test costs, and solve time costs Effect

Active Publication Date: 2019-11-08
CHONGQING UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0009] However, due to cost and technical issues, most of the current high-voltage DC test platforms use half-wave rectification and are connected to a small-capacity AC transformer. The output power of the half-wave rectifier is only half of that of the AC transformer when it is running. The maximum output current of the platform is only tens of milliamps, and the current flowing through the sample under pressure is only a few microamps
At present, the minimum quick-break current of the fuse on the market is 150mA, and the minimum lighting current of the diode is 5mA. When this device is used on a DC test platform, the fuse cannot be blown, the LED lamp cannot be lit, and the Rogowski coil current transformer output The current is too small, and the counter cannot collect signals, so that the three functions of the device cannot be realized
[0010] Therefore, the past multi-sample test system cannot be applied to the test conditions of small-capacity DC power supplies

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  • A multi-sample solid insulation electrical life test system under small-capacity DC power supply
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  • A multi-sample solid insulation electrical life test system under small-capacity DC power supply

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Embodiment Construction

[0039] The preferred embodiments of the present invention will be described in detail below with reference to the accompanying drawings.

[0040] figure 1 Shown is a circuit schematic diagram of a multi-sample solid insulation electrical life test device under a small-capacity DC power supply. The device is divided into a primary circuit and two secondary circuits. The primary circuit is a circuit powered by a high-voltage power supply, such as figure 1 As shown, a variety of samples and electrodes are connected in series with the knife switch, and after the control terminal of the solid state relay, they are connected in parallel. The secondary circuit is a circuit powered by 220V mains, also called a control circuit. There are two secondary circuits in the present invention: one, the switch control circuit: the 220V circuit located at the upper side as shown in the figure is all controlled by the switch The circuit is composed of the output terminal of the solid state relay...

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Abstract

The invention relates to a multi-sample solid insulation electric life test system under a low capacity dc source and belongs to the high voltage technology field. The system comprises a high voltagepower source, a current limit resistor, multiple sets of solid relays I, multiple sets of knife switches, multiple sets of test electrodes and a timing counter, wherein the knife switches, control ends of the solid relays I and the test electrodes are sequentially connected in series to form test branches, the test branches are connected in parallel to form a test circuit, the high voltage power source is connected with one end of the current limit resistor, the other end of the current limit resistor is connected with the test circuit, the other end of the test circuit is connected with control ends of solid relays II, the control ends of the solid relays II are in ground connection and are connected with the high voltage power source to form a primary loop of the test system, and outputends of the solid relays I are connected in series with electromagnetic motion units of the knife switches and are then connected with a commercial power source to form a control branch. The multi-sample solid insulation electric life test system is advantaged in that multi-sample test can be accomplished under the low capacity dc source, acquired data has small dispersibility, and sample characteristics can be more accurately reflected.

Description

technical field [0001] The invention belongs to the high-voltage technical field, and relates to a multi-sample solid insulation electric life testing system under a small-capacity DC power supply. Background technique [0002] For the AC and DC life tests of solid insulating materials, if the accelerated electrical aging test is performed on a single sample one by one, due to the differences in the aging environment for different test times, such as the difference in ambient temperature and humidity, the breakdown time of the samples under the same applied voltage will be reduced. The dispersion is relatively large, the reliability of the obtained electrical life data is low, and the test period is very long. Earlier, Professor Yang Lijun and Yan Shuiqiang of Chongqing University, based on this, designed a multi-sample solid insulation AC / DC life test system, patent number 2016108645066. This system adopts the method of disconnecting the breakdown circuit with the fuse, wh...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/12
Inventor 杨丽君边浩然马志鹏成立郝建赵学童袁媛程之栋孙伟栋
Owner CHONGQING UNIV