Communication fault analysis system applied to long distance

Abstract

The invention discloses a communication fault analysis system applied to a long distance. The communication fault analysis system comprises a noise signal module, a communication signal module, an analysis module, and a judgment module, wherein the noise signal module is used for establishing a noise signal model according to a collected noise signal; the communication signal module is used for establishing a communication signal model according to a collected low-noise communication signal; the analysis module is used for bringing the received communication signal to the noise signal model toobtain a noise parameter; the analysis module is further used for bringing the received communication signal to the communication signal model to obtain a communication parameter; and the judgment module is used for judging the noise parameter and the communication parameter. According to the communication fault analysis system applied to the long distance, the established noise signal model andcommunication signal model can be taken as pre-stored information to store in a microwave signal detection device, such that only the processing of the signal models needs to be operated in the detection device; therefore, the signal detection efficiency is improved; and the size of a microwave detection component is reduced, such that the power consumption of the microwave detection component isgreatly reduced.

Description

technical field [0001] The invention relates to the field of microwave communication, in particular to a communication failure analysis system applicable to long distances. Background technique [0002] With the development of semiconductor technology, semiconductor devices have gradually replaced electron tubes with their obvious advantages. Therefore, low-noise technology is basically solid-state low-noise technology. Low-noise technology research began in the 1940s with point-contact semiconductor diode mixers for radar. Since the advent of varactor diodes in 1958, parametric amplifiers (parameter amplifiers) have been widely used since the 1960s, and quantum amplifiers and tunnel diode amplifiers (tunnel amplifiers) have also been developed in succession during the same period. In the mid-1960s, the use frequency of bipolar transistors was increased to the microwave band, and an L-band low-noise bipolar transistor amplifier was made. In 1971, a microwave gallium arseni...

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Problems solved by technology

[0004] The technical problem to be solved by the present invention is that the existing microwave signal noise detection technology is very complicated, which is not conducive to the miniaturization of microwave detection devices. The purpose is to provide a communication failure analysis system suitable for long distances and solve the above problems

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