Test system and test method for imaging delay time of medium-wave infrared detector
An infrared detector and delay time technology, applied in the field of image processing, can solve the problem of low delay time accuracy, and achieve the effects of improving test accuracy, good scalability, and strong environmental adaptability
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[0054] The present invention will be further described below in conjunction with accompanying drawing. Imaging delay test equipment system structure block diagram of the present invention, as figure 1 , 2 As shown, it includes three parts: target board, control recorder and portable computer.
[0055] Such as image 3 As shown, the target board is composed of a target board, a light shield and a tripod. The target board and lens hood are made of aluminum alloy and shaped like a bell-mouthed box. The target board is the bottom of the box, with an array of infrared LEDs installed in the center and a light shield on the edge. The tripod is used to fix the target board and the hood, and the height of the target board can be adjusted during testing.
[0056] Such as Figure 4 As shown, the interior of the control recorder includes four parts: power supply module, image processing module, LED constant current source module, and interface module. The indicator light, the size...
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