High and low temperature impact test box
An impact test chamber, high and low temperature technology, applied in the field of electronic devices, can solve the problems of wasting energy in the test effect, achieve good heat preservation effect, improve test effect, and avoid waste
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[0013] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0014] The present invention provides such as figure 1 A high and low temperature impact test chamber is shown, including a chamber body 1, a high temperature chamber 2, a low temperature chamber 3, a load basket and test components 4, an evaporator 5, a refrigeration device 6, a water outlet 7, a water inlet 8, and a pneumatic transmission Device 9, heat exchanger 10, motor 11, heater 12 and rotating wheel 13, described box body 1 is provided with high-temper...
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