Test method for carrying out single particle effect evaluation for application reinforcing device

A single event effect and test method technology, which is applied in the field of particle irradiation testing, can solve the problems of underestimating the application reinforcement effect, inaccurate test results, and two errors.

Active Publication Date: 2018-04-27
CHINA ACADEMY OF SPACE TECHNOLOGY
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] EDAC can only correct errors in areas that have been read, and cannot correct errors that have not been read. If the ground test fluence rate is too high and the cumulative fluence is too large, before reading, two bits of a certain bit have flipped, and the Unable to correct errors; as long as two errors do not occur at the same time in TMR, the error of the faulty module can be covered up to ensure the correct output of the system. Error correction; the fluence rate of space high-energy particles is generally 0-10ions / cm 2 .s, the timing refresh frequency suitable for space use, often appears too low in ground simulation tests, and has accumulated a lot of errors before it can be refreshed in time
[0008] To sum up, the commonly used ground simulation test method, due to the difference between the fluence rate, the total fluence and the on-orbit situation, makes the test results inaccurate and often seriously underestimates the effect of applied reinforcement

Method used

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  • Test method for carrying out single particle effect evaluation for application reinforcing device
  • Test method for carrying out single particle effect evaluation for application reinforcing device
  • Test method for carrying out single particle effect evaluation for application reinforcing device

Examples

Experimental program
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Embodiment Construction

[0036] like figure 1 As shown, the single event effect evaluation test method of the application hardened device combined with the space environment includes:

[0037] 1) Combined with the actual application of hardening measures on the device, determine the maximum time interval t for the hardening measures to take effect;

[0038] 2) Combining the reinforcement action time t obtained in step 1), combined with the space orbit environment where the device is located and the shielding situation of the spacecraft, calculate the particle integral fluence f corresponding to the LET value of the test particle incident on the device within the time t n ;

[0039] 3) Integral fluence f of particles incident on the device under the LET value within the maximum time interval t during which the reinforcement measures obtained in step 2) take effect n , and ion i n The minimum fluence at which single event effects occur on the device under irradiation, determining the ion i n F n ; ...

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Abstract

The invention relates to a test method for carrying out single particle effect evaluation for an application reinforcing device, particularly relates to an application reinforcing device single particle effect evaluation test method in combination with the space environment and belongs to the particle irradiation test technology field. The application reinforcing effects of EDAC, TMR and timing refreshing adopted by the device can be more accurately tested. After continuous irradiation for the device to the certain amount, e.g., 107ions / cm<2>, statistics of the single particle effect number iscarried out, effectiveness of reinforcing measures and correlativity of the incident particle cumulative fluence in the reinforcing error correction period are considered, in combination with actualapplication conditions of the device and the on-orbit space environmental conditions, the single irradiation fluence is set, irradiation stops whenever the irradiation fluence is realized, and the application reinforcing device is configured to be in an initial state to continue the test. The method is advantaged in that a problem of the severely-underestimated application reinforcing effect caused by abnormal single particle false accumulation because of the overlarge ground test accumulation fluence in the prior art is solved.

Description

technical field [0001] The invention relates to a test method for evaluating the single event effect of an application-hardened device, in particular to a test method for evaluating the single-event effect of an application-hardened device combined with the space environment, which belongs to the technical field of particle radiation testing and is suitable for using EDAC (Error Detection And Correction), TMR (Triple Modular Redundancy), timed refresh and other reinforcement measures applied to the single event effect detection of the device. Background technique [0002] With the improvement of satellite model performance indicators and the increasing pressure of micro-satellite cost control, more and more high-performance commercial devices are applied to satellite model missions. Most of these high-performance commercial devices are not designed for anti-single event upset, which is prone to single event upset in orbit. When satellite models use these single-event upset-...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01S19/20G06F17/50H03M13/03
CPCG01S19/20G06F30/20H03M13/03
Inventor 罗磊孙毅于庆奎张洪伟梅博李晓亮
Owner CHINA ACADEMY OF SPACE TECHNOLOGY
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