Semiconductor Laser Diode Having Multi-Quantum Well Structure
一种激光二极管、半导体的技术,应用在半导体激光器、有源区的结构、激光器等方向,能够解决光栅异常生长、不能补偿光栅不连续性等问题
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[0017] 1 shows a cross-sectional view of a semiconductor laser diode (LD) 1 viewed from the direction in which laser light propagates according to a first embodiment of the present invention; Figure 1B also shows LD 1 along the Figure 1A A section taken along the line IB-IB shown. The LD 1 of this embodiment provides an n-type InP substrate 2, an n-type InP lower cladding layer 3, an active layer 4, a p-type InP upper cladding layer 5, a p-type InP barrier layer 6, an n-type InP barrier layer 7. A p-type InP layer 8 , a contact layer 9 , a passivation film 10 , a p-type electrode 11 and an n-type electrode 12 .
[0018] The n-type InP lower cladding layer 3 , the active layer 4 and the p-type upper cladding layer 5 are stacked on the n-type InP substrate 2 in this order. These layers of n-type InP lower cladding layer 3 , active layer 4 , and p-type upper cladding layer 5 form a mesa having a height of, for example, 2.0 μm.
[0019] The n-type InP substrate 2 is doped with...
no. 2 example
[0032] Next, the process of forming LD will be described. First, if Figure 6A As shown, grating layer 30 is grown epitaxially on semiconductor wafer 16 . Then, if Figure 6B As shown, a photoresist pattern is formed on the grating layer 30 , with subsequent etching of the grating layer 30 using the photoresist pattern as an etch mask, the corrugations 14 may be formed in the grating layer 30 . Semiconductor wafer 16 operates as n-type InP substrate 2 in LD1.
[0033] Then, the corrugation 14 is buried with the n-type InP lower cladding layer 3 . The n-type InP lower cladding layer 3 can be doped with 1.0×10 18 cm -3 concentration of Si and has a thickness of, for example, about 0.5 μm. Thereafter, the process epitaxially grows active layer 4 on n-type lower cladding layer 3 . By metal-organic chemical vapor deposition (MOCVD) technique, using trimethylindium (TMI), which are respectively used as sources of indium (In), gallium (Ga), aluminum (Al), arsenic (As) and phos...
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