The invention provides a
pretreatment method for analyzing trace impurities in trimethyl
indium, which comprises the following steps: taking trimethyl
indium in an
inert atmosphere operation box by adopting a sampling device, placing the trimethyl
indium in a dry sampling
bottle, sealing the dry sampling
bottle to obtain a
metal organic compound, and taking the dry sampling
bottle out of the
inert atmosphere operation box; weighing the total weight of the dry sampling bottle and the
metal organic compound, and adding a water-insoluble
organic solvent into the dry sampling bottle on a hundred-grade super clean bench, so that the
organic solvent reacts with the
metal organic compound to obtain a first solution; adding a first
dilute acid solution into the dry sampling bottle, reacting concentrated acid with the first solution, and heating to remove
alkane to obtain a second solution; and adding a second
dilute acid solution into the second solution in the dry sampling bottle to prepare a solution to be detected. The method has the advantages of being easy to operate, good in safety, short in detection time, free of environmental
pollution, good in analysis result
repeatability, wide in applicability and the like.