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Preparation method of p type GaN and AlGaN semiconductor material

A semiconductor, p-type technology, used in semiconductor/solid-state device manufacturing, electrical components, circuits, etc., can solve problems affecting the performance of optoelectronic devices, adverse production and commercial applications, narrow growth windows, etc., to reduce defect density, The effect of increasing hole concentration and improving crystal quality

Active Publication Date: 2013-01-30
SUN YAT SEN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although this method can make good use of the hole gas formed by the energy band oscillation of the heterointerface to obtain a higher hole concentration, the superlattice structure is composed of two semiconductor materials with different band gaps alternately stacked and grown. Yes, these two different materials will be different in light absorption intensity and cut-off wavelength, which will affect the performance of optoelectronic devices made using them; acceptor-donor co-doping method (High Doped p-Type GaN Grown by Alternative Co-Doping Technique, Mat. Res. Soc. Symp. Proc. Vol. 719, 2002), although the acceptor-donor Coulomb interaction can be used to effectively reduce the acceptor-doped magnesium atom Ionization energy, but the growth window of this method is very narrow, it is difficult to realize, and it is not conducive to large-scale production and commercial application

Method used

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  • Preparation method of p type GaN and AlGaN semiconductor material
  • Preparation method of p type GaN and AlGaN semiconductor material
  • Preparation method of p type GaN and AlGaN semiconductor material

Examples

Experimental program
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Embodiment 1

[0037] This implementation case will be described in detail figure 1 The growth structure of the p-type GaN semiconductor material is shown as image 3 shown. A buffer layer 302 , an unintentionally doped GaN layer 303 and an acceptor Mg-doped GaN layer 304 are sequentially grown on the sapphire substrate 301 by using a metal organic chemical vapor deposition (MOCVD) epitaxial growth method.

[0038] In the growth process of this embodiment, ammonia gas is used as the Group V nitrogen source; trimethyl gallium is used as the Group III gallium source; and trimethyl indium is used as the surfactant in the acceptor Mg-doped GaN layer 304 . The realization of this structure includes the following six steps:

[0039] (1) Place the c-plane sapphire substrate 301 in the reaction chamber, and use the metal organic chemical vapor deposition (MOCVD) epitaxial growth method to grow on the sapphire substrate 301 image 3 The epitaxial structure shown.

[0040] (2) The buffer layer (30...

Embodiment 2

[0050] This implementation case will be described in detail figure 1 The growth structure of the p-type AlGaN semiconductor material shown, as Figure 5 shown. A buffer layer 502 , an unintentionally doped AlGaN layer 503 and an acceptor Mg-doped AlGaN layer 504 are sequentially grown on the sapphire substrate 501 by a metal organic chemical vapor deposition (MOCVD) epitaxial growth method.

[0051] In the growth process of this example, ammonia gas is used as the source of Group V nitrogen; trimethylgallium is used as the source of Group III gallium, and trimethylaluminum is used as the source of Group III aluminum; The acceptor Mg-doped AlGaN layer 304 is used. The realization of this structure includes the following six steps:

[0052] (1) Place the c-plane sapphire substrate 501 in the reaction chamber, and use the metal organic chemical vapor deposition (MOCVD) epitaxial growth method to grow on the sapphire substrate 501 Figure 5 The epitaxial structure shown.

[0...

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Abstract

The invention discloses a preparation method of a p type GaN and AlGaN semiconductor material. A substrate, and a buffer layer or a transition layer, an unintended doped layer and an acceptor doped layer grown on the substrate from bottom to top are contained; in a growth process of the structure, ammonia or nitrogen dimethylhydrazine is used as a five-group nitrogen source; trimethyl gallium or TEGa used as a three-group gallium source, trimethylaluminium or triethyl aluminum used as a three-group aluminium source, and trimethylindium or TEIn used as a three-group indium source are collectively called three-group metal sources; and the trimethylindium or the TEIn is also used as a surface active agent and used in the acceptor doped layer. According to the method, the trimethylindium or the TEIn is used as the surface active agent to assist growth, and simultaneously, the acceptor doped layer is prepared by adopting a delta doping method. According to the method, the doping efficiency of acceptor doped magnesium atoms is increased, and simultaneously, the self-compensation effect is suppressed, so that the p type GaN and AlGaN semiconductor material with favorable crystalline quality and high hole concentration is obtained.

Description

technical field [0001] The invention relates to the technical field of epitaxial growth of p-type GaN and AlGaN semiconductor materials, in particular to a method for preparing p-type GaN and AlGaN semiconductor materials by using surfactant-assisted delta doping. Background technique [0002] Group III nitrides (also known as GaN-based materials), as the third-generation semiconductor materials, have the characteristics of large band gap, direct band gap (high photoelectric conversion efficiency), stable chemical properties, strong thermal conductivity and high breakdown voltage. Based on this type of semiconductor material, optoelectronic devices with high photoelectric conversion efficiency and high response speed (such as blue-green light-emitting diodes, semiconductor lasers and ultraviolet photodetectors) and high-temperature resistant, high-voltage resistant, high-power electronic devices ( Such as high electron mobility transistors and high power switching field effe...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/205
Inventor 江灏陈英达
Owner SUN YAT SEN UNIV
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