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Assembly method and device for a full field of view lens

An assembly method and technology of an assembly device are applied in optical components, instruments, optics, etc. to achieve the effects of improving assembly accuracy and efficiency, high work efficiency, and wide application range.

Active Publication Date: 2020-05-22
北京全欧光学检测仪器有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, this patent only realizes arbitrary changes in the relative positions of the lens and the image sensor through two platforms, so as to realize assembly, and cannot solve the above-mentioned problems

Method used

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  • Assembly method and device for a full field of view lens
  • Assembly method and device for a full field of view lens
  • Assembly method and device for a full field of view lens

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Embodiment Construction

[0043] The present invention will be described in detail below in conjunction with specific embodiments. The following examples will help those skilled in the art to further understand the present invention, but do not limit the present invention in any form. It should be noted that those skilled in the art can make several modifications and improvements without departing from the concept of the present invention. These all belong to the protection scope of the present invention.

[0044] like figure 1 As shown, it is the schematic diagram of the existing lens MTF measurement, that is, the MTF (modulation transfer function) is used as the evaluation standard, and the MTF values ​​of different fields of view are required to be detected. The principle of adjustment during assembly is that when the lens inside the lens is eccentric or tilted, the measured MTF value will be much different from the design value. According to the comparison between the measured MTF value and the des...

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Abstract

The invention provides a full-field lens assembling method which comprises the following steps: measuring wavefront of a measured lens at different full-field positions; processing the information ofthe wavefront at different positions to obtain various aberrations; and integrating the obtained aberrations, and adjusting the assembling position of the measured lens according to the integrated result. The invention further provides a full-field lens assembling device for realizing the method. The assembling device comprises a light source, a reticle, a telescope system and a wavefront sensor,wherein the wavefront sensor is used for receiving wavefront formed by parallel beams exiting from the telescope system and measuring the actual wavefront information; and the wavefront comprises an on-axis wavefront and an off-axis wavefront, and is used for adjusting the measured lens by comprehensively considering the full-field wavefont condition. The assembly mode for wavefront measurement replaces the traditional MTF-based assembling manner, the assembling accuracy and efficiency are improved, and large-scale production of a high-performance lens is realized.

Description

technical field [0001] The invention relates to an assembly technology of an optical device, in particular to an assembly method and device for a full field of view lens. Background technique [0002] In recent years, with the vigorous development of the mobile phone industry, the annual shipment of optical lenses on mobile phones has increased year by year, and the market has higher and higher requirements for lens performance. Traditional lens assembly uses MTF as the evaluation standard, and requires the detection of MTF values ​​in different fields of view. The measurement principle diagram during assembly is as follows: figure 1 shown. The principle of adjustment during assembly is that when the lens inside the lens is eccentric or tilted, the measured MTF value will be much different from the design value. According to the comparison between the measured MTF value and the design value, the lens can be adjusted until the MTF value until the requirements are met. [0...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G02B27/62
CPCG02B27/62
Inventor 田贺斌何志远
Owner 北京全欧光学检测仪器有限公司
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