Method for improving measuring accuracy of polarization performance of Y waveguide device

Abstract

The invention provides a method for improving the measuring accuracy of the polarization performance of a Y waveguide device. The method comprises the following steps: firstly, connecting an input polarization-maintaining tail fiber of a Y waveguide to be measured with a polarization-maintaining tail fiber connecting point of a polarizer, setting the countershaft angle of the output polarization-maintaining tail fiber of the Y waveguide and the polarization-maintaining tail fiber connecting point of a polarization analyzer to be 0 degree, obtaining a polarization parameter measurement result for the first time; simultaneously adjusting the countershaft angles of the two connecting points to be 90 degrees, so as to obtain a second measurement result; and finally, calculating the average value of the two measurement results as the final measurement value. According to the measuring method, a measuring optical path structure does not need to be changed, and the measuring method is simpleand effective, and easy to realize. The measurement error caused by the self structure and performance defect of a polarizer and a polarization analyzer in an optical path to be measured is eliminated, so that the measurement accuracy is further improved. The method can be widely applied to high-precision measurement of parameters such as extinction ratio of a Y waveguide device chip.

Description

technical field [0001] The present invention relates to a method for measuring polarized optical devices, specifically a method for measuring the polarization performance of a Y waveguide device, eliminating the measurement error introduced by the angle deviation of the polarizer / analyzer itself in the optical path to be measured, and further Ways to improve measurement accuracy. Background technique [0002] Multifunctional integrated optical chip (commonly known as Y waveguide), usually adopts titanium diffusion or high temperature proton exchange manufacturing process, and grows Y-shaped optical waveguide on lithium niobate substrate. The Y waveguide highly integrates the functions of single-mode optical waveguide, optical beam splitter, electro-optical phase modulator and optical polarizer. Due to its functional integration and miniaturization, it has gradually become an interferometric fiber optic gyroscope and fiber optic current The core components of high-precision ...

AI Technical Summary

Problems solved by technology

However, due to the structural and performance defects of the optical device itself, such as the polarizer / analyzer in the optical path to be tested, the polarization angle of the polarizer / analyzer usually deviates from the standard 45°, and this angle deviation directly leads to the measurement error of the chip extinction ratio

Experimental results show that only an angular deviation of 2° will cause a measurement error of 0.6dB, so the impact cannot be ignored, and there is currently no effective method to eliminate the measurement error

Images