Spectrum measurement system, spectrum measurement device, optical measurement method and optical correction method

An optical correction and spectroscopy technology, applied in the field of spectral measurement system and optical correction, can solve the problems of reducing the accuracy of the spectral radiant flux, inconsistent measurement results, weakening the effect of correction, etc.

Active Publication Date: 2018-07-24
OTO PHOTONICS
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Problems solved by technology

[0003] However, when each spectrometer is calibrated by receiving the light from the standard lamp of the spectroscopic radiant flux, stray light will be generated inside these spectrometers, and the stray light will adversely affect the measurement results and reduce the spectroscopic radiant flux accuracy, thereby weakening the effect of the a

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  • Spectrum measurement system, spectrum measurement device, optical measurement method and optical correction method
  • Spectrum measurement system, spectrum measurement device, optical measurement method and optical correction method
  • Spectrum measurement system, spectrum measurement device, optical measurement method and optical correction method

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[0022] The present invention will be further explained by way of examples below, but the present invention is not limited to the scope of the described examples.

[0023] See figure 1 , Which shows a block diagram of the spectrum measuring device 100. in figure 1 In the illustrated embodiment, the spectrum measuring device 100 can measure the optical spectrum, and includes an optical module 110 and a circuit module 120, and the spectrum measuring device 100 may be a spectrometer, a spectrophotometer, or a spectrophotometer. Or integrating sphere measuring system or colorimeter. The optical module 110 can receive the survey light L1 and generate multiple spectral beams L2 from the survey light L1. The circuit module 120 can receive these spectral light beams L2, and convert these spectral light beams L2 into electrical signals containing spectrum information.

[0024] The optical module 110 includes a light input part 111 and a spectrum generating part 112, wherein the light input...

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Abstract

An optical correction method is performed by a spectrum measurement device with a light input part. The method includes the following steps: multiple narrow-band rays are measured by the light input part to obtain multiple narrow-band spectrum impulse responses; a stray light database is built according to the narrow-band spectrum impulse responses; a correction program is generated according to the stray light database; and spectral radiant standard light is received from the light input part, and the spectrum measurement device enabling the correction program measures the spectrum of the spectral radiant standard light to obtain measured spectrum data; and a correction coefficient program is generated according to the measured spectrum data and spectral radiant standard spectrum data, and the correction coefficient program can match the measured spectrum data with the spectral radiant standard spectrum data.

Description

Technical field [0001] The present invention relates to an optical measurement system (optical measurement system), an optical measurement device, and an optical correction method, and more particularly to a spectrum measurement system, a spectrum measurement method, and an optical correction method applied to the foregoing two. Background technique [0002] A spectrometer is a common optical measurement device that can analyze light to obtain a spectrum. Nowadays, many industries, such as biotechnology, display panel manufacturers, and light emitting diode (Light Emitting Diode, LED) manufacturers, mostly own Several spectrometers used in production lines. These spectrometers use a spectral radiant flux standard lamp, such as a halogen lamp, to perform a spectral radiant flux calibration before measuring a product or sample for the first time. spectralradiant flux calibration). [0003] However, when each spectrometer receives the light of the spectroradiometric flux standard la...

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Application Information

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IPC IPC(8): G01J3/28G01J3/02
CPCG01J3/0262G01J3/28G01J2003/2866
Inventor 洪健翔林昇旺郑旭峯
Owner OTO PHOTONICS
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