Step-in type high-low-temperature fast temperature change test box

Abstract

The invention discloses a step-in type high-low-temperature fast temperature change test box, which comprises a device main body, a refrigeration chamber and a heat regeneration box, wherein a door handle is arranged in the middle of the device main body and is fixedly connected with the device main body; a vacuum layer is arranged in the middle of the inside of the device main body; the vacuum layer is tightly welded with the device main body; the right end of an information processing device is provided with a center processing chip; the central processing chip is electrically connected withthe information processing device; an observation window is arranged in the middle position of an isolation layer; the observation window is connected with the isolation layer in a penetrated way; the bottom end of the device main body is provided with a moving part; the moving part is fixedly connected with the device main body; the step-in type high-low-temperature fast temperature change testbox is provided with a moving part; a rubber tire is used; the device main body can be moved through the pushing by people; meanwhile, the moving track of the moving part is further changed through changing the thrust direction; the moving is convenient; the labor saving effect is achieved; in addition, certain vibration performance is realized in the pushing process; the equipment is enabled notto be damaged in the moving process.

Description

technical field [0001] The invention relates to the technical field of test chambers, in particular to a walk-in high and low temperature rapid temperature change test chamber. Background technique [0002] The test equipment is mainly used to conduct environmental simulation tests on the physical and other related characteristics of the product in accordance with national standards or user-defined requirements under low temperature, high temperature, and conditions. After the test, the performance of the product can be judged by inspection , whether it can still meet the predetermined requirements, so as to be used for product design, improvement, appraisal and factory inspection. Adaptability test of electronic products, their original devices, and other materials during storage, transportation, and use in high-temperature and low-temperature environments. [0003] Existing test chambers are too bulky and inconvenient to carry. They are easily damaged and laborious during...

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to provide a walk-in high and low temperature rapid temperature change test box to solve the problems of insufficient safety performance, inconvenient handling and poor thermal insulation performance in the above background technology

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