Step-in type high-low-temperature fast temperature change test box

A high-low temperature, walk-in technology, used in the field of test chambers, can solve the problems of insufficient safety performance, poor thermal insulation performance, inconvenient handling, etc., and achieve the effects of good stability, convenient movement, and easy wiping.

Inactive Publication Date: 2018-07-27
武汉博富通试验设备有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The purpose of the present invention is to provide a walk-in high and low temperature rapid temperature change test box to solve the problems of insufficient safety performance, inconvenient handling and poor thermal insulation performance in the above background technology

Method used

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  • Step-in type high-low-temperature fast temperature change test box
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  • Step-in type high-low-temperature fast temperature change test box

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Embodiment Construction

[0018] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0019] see Figure 1-3 , the present invention provides a technical solution: a walk-in high and low temperature rapid temperature change test box, comprising a device main body 1, a refrigeration chamber 8 and a heating box 10, the left end of the device main body 1 is provided with an isolation layer 3, the isolation layer 3 Closely welded with the device main body 1, a door handle 7 is arranged in the middle of the device main body 1, and the door handle 7 ...

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Abstract

The invention discloses a step-in type high-low-temperature fast temperature change test box, which comprises a device main body, a refrigeration chamber and a heat regeneration box, wherein a door handle is arranged in the middle of the device main body and is fixedly connected with the device main body; a vacuum layer is arranged in the middle of the inside of the device main body; the vacuum layer is tightly welded with the device main body; the right end of an information processing device is provided with a center processing chip; the central processing chip is electrically connected withthe information processing device; an observation window is arranged in the middle position of an isolation layer; the observation window is connected with the isolation layer in a penetrated way; the bottom end of the device main body is provided with a moving part; the moving part is fixedly connected with the device main body; the step-in type high-low-temperature fast temperature change testbox is provided with a moving part; a rubber tire is used; the device main body can be moved through the pushing by people; meanwhile, the moving track of the moving part is further changed through changing the thrust direction; the moving is convenient; the labor saving effect is achieved; in addition, certain vibration performance is realized in the pushing process; the equipment is enabled notto be damaged in the moving process.

Description

technical field [0001] The invention relates to the technical field of test chambers, in particular to a walk-in high and low temperature rapid temperature change test chamber. Background technique [0002] The test equipment is mainly used to conduct environmental simulation tests on the physical and other related characteristics of the product in accordance with national standards or user-defined requirements under low temperature, high temperature, and conditions. After the test, the performance of the product can be judged by inspection , whether it can still meet the predetermined requirements, so as to be used for product design, improvement, appraisal and factory inspection. Adaptability test of electronic products, their original devices, and other materials during storage, transportation, and use in high-temperature and low-temperature environments. [0003] Existing test chambers are too bulky and inconvenient to carry. They are easily damaged and laborious during...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B01L1/00B01L7/00
CPCB01L1/00B01L7/00
Inventor 黄发新
Owner 武汉博富通试验设备有限公司
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