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Radiation rate control device and radiation rate control method

A control device, emissivity technology, applied in the field of emissivity control device, can solve problems such as change

Active Publication Date: 2018-07-31
MISSION INFRARED ELECTRO OPTICS TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The emissivity used in the measurement can be determined by manually setting it in the thermal imager according to the emissivity tables corresponding to various materials; but when the temperature of the measured object is in a changing state, especially at 500 When the temperature is above 100 degrees Celsius, the emissivity of many materials changes with the change of temperature, and it is difficult to determine the emissivity of the material at this time

Method used

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  • Radiation rate control device and radiation rate control method
  • Radiation rate control device and radiation rate control method

Examples

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Embodiment 1

[0029] Embodiment 1 uses a portable thermal imaging device 13 with a shooting function as an example of an emissivity control device. refer to figure 1 Next, the structure of the thermal imaging device 13 will be described. The thermal imaging device 13 has a photographing part 1, an image processing part 2, a display and control part 3, a display part 4, a communication I / F5, a temporary storage part 6, a memory card I / F7, a memory card 8, a flash memory 9, an operation part 10, The control unit 11 is responsible for overall control of the thermal imaging device 13 by connecting the control and data bus 12 with the above corresponding parts.

[0030] The imaging unit 1 is composed of unillustrated optical components, lens driving components, infrared detectors, signal preprocessing circuits, and the like. The optics consist of an infrared optical lens for focusing the received infrared radiation onto the infrared detector. The lens driving part drives the lens to perform f...

Embodiment 2

[0056] Embodiment 2, relates to the measurement of 2 kinds of materials, reference Figure 6-Figure 7 , to illustrate embodiment 2;

[0057] Such as Figure 7 As shown, in the experiment, heating of material 1 and material 2 is involved. For example, the analysis area S01\S02 for material 1 and material 2 can be preset respectively; and the associated material type can be selected according to the analysis area S01\S02;

[0058] Step C01, taking pictures to obtain thermal image data;

[0059] Step C02, according to the first emissivity of the material in each analysis area, measure and obtain the temperature value of each analysis area; in the initial test state, the default emissivity such as 0.9 can be used as the first emissivity to calculate the new shooting In the obtained thermal image data, the respective temperature values ​​of material 1 and material 2;

[0060] Step C03, the temperature value will be obtained according to the first emissivity measurement, and comp...

Embodiment 3

[0066] Embodiments of the present invention are not limited to portable thermal imaging devices, and can also be applied to various online thermal imaging devices; Applied to thermal image processing devices that receive and process thermal image data from the outside.

[0067] Such as Figure 8-Figure 9 As shown, a thermal image processing device such as a computer, a personal digital assistant, a display device used in conjunction with a thermal image capture device with a shooting function, etc., as an example of an emissivity control device, is used to determine the emissivity of the acquired thermal image data and analysis.

[0068] refer to Figure 8 It is a block diagram of an implementation of an electrical structure of a thermal image processing system formed by connecting the emissivity control device 100 (thermal image processing device 100 ) and the thermal image shooting device 101 .

[0069] The thermal image processing device 100 has a communication interface...

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Abstract

The invention discloses a radiation rate control device and a radiation rate control method and relates to the measurement application field. In the prior art, a radiation rate adopted during measurement is determined through manually setting in a thermal imager according to a radiation rate table corresponding to various kinds of materials. When the temperature of a measured object is in a changing state, the radiation rates of several kinds of materials are changed along with the change of the temperature. The determination of the radiation rate of the material at the moment is difficult. The radiation rate control device determines the second radiation rate of the measured object according to the corresponding relation of first analysis data and the radiation rate. A problem existing inthe prior art is solved.

Description

technical field [0001] The emissivity control device and the emissivity control method of the present invention relate to the application field of thermal image detection. Background technique [0002] When it is necessary to analyze the thermal image of the measured body, the user can set the analysis area for points, lines, surfaces, etc. of specific parts of the thermal image of the measured body to obtain the analysis results. [0003] Taking the temperature analysis of the thermal image data obtained by shooting as an example, as is well known to those skilled in the art, prescribed processing such as correction and interpolation can be performed, based on the position parameters of the analysis area in the infrared thermal image, for example, the extraction of the set analysis area The determined thermal image data is converted to temperature values ​​to obtain the temperature values ​​corresponding to these thermal image data, and then the obtained temperature values ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J5/00G01J5/12
CPCG01J5/00G01J2005/0077G01J5/802
Inventor 王浩
Owner MISSION INFRARED ELECTRO OPTICS TECH
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