Vacuum absorbing template for semiconductor wafer polishing device and polishing device
A technology of vacuum adsorption and polishing device, which is applied to surface polishing machine tools, grinding/polishing equipment, grinding workpiece supports, etc., can solve the problems of complex polishing process, environment cost, time-consuming and labor-intensive, and reduce production costs. , Improve the yield and thickness uniformity, and shorten the processing time.
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Embodiment 1
[0024] This embodiment provides a vacuum adsorption template for a semiconductor wafer polishing device, which is used to position the wafer 3 so as to realize single-sided polishing of the wafer 3, see Figure 1-3 As shown, the vacuum adsorption template includes a ceramic disc 1 positioned on the polishing head 4. The key design of this embodiment is that a groove is provided on the surface of the ceramic disc 1, and the shape of the groove is consistent with the shape of the wafer 3 to be polished. , if it can be square or other, it is cylindrical in the present embodiment; the number of grooves on the surface of the ceramic disc 1 can be customized according to the actual situation, and there are 2 in the present embodiment; a vacuum suction cup 2 is positioned in the groove , the positioning method is vacuum adsorption, the peripheral edge of the vacuum chuck 2 extends downward to form a visor 2-1 structure, because the peripheral edge extends downward, the middle part for...
Embodiment 2
[0029] The difference from Embodiment 1 is that in this embodiment, the vacuum suction cup 2 is bonded in the groove of the ceramic disc 1 to achieve positioning. If replacement is required, remove the vacuum and replace the ceramic disc 1 to achieve.
[0030]Put the InP wafer into the common porous ceramic vacuum adsorption template and the vacuum adsorption template described in the above-mentioned embodiment 1 respectively, and perform single-sided polishing. Under the same vacuum negative pressure, the vacuum adsorption template described in the embodiment 1 absorbs Strong force, firm adsorption, no shedding phenomenon, no scratches and wear on the side and the adsorbed surface; while the shedding rate of ordinary porous ceramic vacuum adsorption templates is higher than 30%, and the occurrence rate of side scratches or scratches on the adsorbed surface is higher than 30%; Slightly increase the vacuum negative pressure, the wafer packed into the vacuum adsorption template o...
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