High-dynamic-range precise scattering feature measuring system

Abstract

The invention provides a high-dynamic-range precise scattering feature measuring system. The distribution and the size of the surface scattering features of a sample to be tested can be precisely obtained. The detection system mainly comprises a light source module, a signal modulation module, an energy attenuation module, a collimation and beam expanding module, a polarization module, a gatheringlens group, a needle hole, a focusing lens group, a sample to be tested, a variable diaphragm, a coupling lens group, a view field diaphragm, a photoelectric detector, a light extinction trap, a dataprocessing system, a signal demodulation module, a light extinction dark chamber, a light source angle scanning mechanism, a sample regulation mechanism and a detector angle scanning mechanism. The scattering feature measuring system has the advantages of high dynamic range, high precision, wide wavelength range, polarization modulation capability and the like.

Description

technical field [0001] The invention belongs to the technical field of high-precision measurement, and in particular relates to a high dynamic range precision scattering characteristic measurement system, which can accurately measure the scattering characteristic. Background technique [0002] Before the 1970s, scholars from various countries have not found a method to effectively study the distribution characteristics of light reflection distribution of various target materials in space. Until 1970, Nicodemus of the United States officially introduced the concept of bidirectional reflection distribution function (BRDF) into the study of target scattering characteristics, which organically unified the reflection and scattering characteristics of the material surface into the same concept. In foreign countries, research on target scattering characteristics is always carried out in a confidential state, and the research in the United States is at the highest level in the world...

AI Technical Summary

Problems solved by technology

[0002] Before the 1970s, scholars from various countries have not found a method to effectively study the distribution characteristics of various target materials in space light reflection

This is the most accurate BRDF measurement device with adjustable wide spectral band developed at that time, but at that time they did not realize the relationship between BRDF measurement and the geometric dimensions of the system and the mechanical accuracy of the goniometer

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