Adaptive noise reduction-based Fourier diffraction scanning microscope imaging method
A technology of scanning microscope and imaging method, which is applied in the direction of editing/combining graphics or text, etc., which can solve the problems of large noise interference, low final imaging resolution, and slow reconstruction speed, so as to reduce the number of iterations and improve the quality of high-resolution intensity images , reducing the effect of Poisson and Gaussian noise
Active Publication Date: 2018-09-14
BEIJING INSTITUTE OF TECHNOLOGYGY
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[0005] It can be seen that the existing computational microscopy imaging methods have problems such as slow reconstruction speed, large noise interference, and low final imaging resolution.
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[0036] The present invention will be described in detail below with reference to the accompanying drawings and examples.
[0037] Please refer to figure 1 , figure 1 An adaptive noise reduction Fourier diffraction scanning microscope imaging method provided by an embodiment of the present invention is shown, the method includes the following steps:
[0038] S1. For the Fourier diffraction scanning microscope, an adaptive phase contrast DPC method is used to calculate the initial value of the phase.
[0039] The Fourier diffraction scanning microscope system based on DPC used in the embodiment of the present invention, its structural diagram is as follows figure 2 As shown, the objective lens of the microscope system is only a 4x mirror, and the image is directly imaged on the CCD camera at the eyepiece. Different from the traditional optical microscope, the light source of the Fourier diffraction scanning microscope is a special LED array. This system uses a 7×7 LED array....
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The invention discloses an adaptive noise reduction-based Fourier diffraction scanning microscope imaging method. The method specifically includes the following steps that: as for a Fourier diffraction scanning microscope, a phase initial value is obtained through adopting a DPC method; a low-power lens and an LED array in the Fourier diffraction scanning microscope are adopted to collect images under different incident angles, wherein the images under the different incident angles are corresponding to different frequency domain apertures in the frequency domain; the frequency-domain image ofan image corresponding to a vertical incident angle is adopted as the initial frequency domain image, and the phase value of the initial frequency domain image is replaced with the phase initial value, and iteration is performed; during the iterative process, the phase of the initial frequency domain image is unchanged in the space domain, the intensity of the initial frequency domain image is replaced by the intensity of an image under an incident angle corresponding to the frequency domain aperture of the initial frequency domain image, and then the initial frequency domain image is converted back to the frequency domain; an inputted frequency domain image of the next iteration is selected according to a step size, and iteration is carried out repeatedly until the iteration of the frequency domain images of the images of all the incident angles is completed, wherein the step size is an adaptive step size; iteration is repeated again until a reconstructed complex amplitude image converges, and finally, a result image is obtained.
Description
technical field [0001] The present invention relates to the field of computational microscopic imaging, in particular to an adaptive noise reduction Fourier diffraction scanning microscope imaging method. Background technique [0002] In recent years, optical microscopes have been widely used in the fields of biology, chemistry, and medicine. With the development of microscopes and related technologies, many fields have demanded optical microscopes with wide field of view, high resolution, large depth of field, and long working distance. . The performance of a traditional microscope system mainly depends on the NA (numerical aperture) of the microscope objective lens. The objective lens with a lower NA value has a larger field of view and a larger working distance, which is suitable for observing the overall situation of the sample, but because the cutoff frequency at this time is , so the details cannot be seen clearly; while the objective lens with high NA value has highe...
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Login to View More IPC IPC(8): G06T11/60
CPCG06T11/60
Inventor 许廷发陈思凝张继洲王杏张一舟
Owner BEIJING INSTITUTE OF TECHNOLOGYGY