Intelligent verification system and detection method for micrometer

A micrometer, intelligent technology, applied in the direction of the micrometer, etc., can solve the problems such as the verification accuracy of the micrometer displacement and deformation of the physical measuring block, and achieve the effect of ensuring the accuracy

Pending Publication Date: 2018-09-28
三明图灵智能科技有限公司
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Problems solved by technology

[0002] At present, there are some automatic methods for micrometer verification, but these verification methods often have some shortcomings, such as the displacement and deformation of the micrometer during verification, the deformation of the physical measuring block, and the influence of the mechanical deformation of the verification mechanism on the verification accuracy. How to solve it is a research direction

Method used

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  • Intelligent verification system and detection method for micrometer
  • Intelligent verification system and detection method for micrometer

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Embodiment 2

[0086] Such as Figure 12 As shown, compared with the first embodiment, in the second embodiment, part of the structure of the vision system 1 (the first vision module) is changed to an air bearing guide rail, a flat linear motor and a high-precision grating ruler, and the vision system 2 (the second vision module) is changed to module) is shortened, and is fixed on the connecting plate 41 together with the visual light source 2 and moves together with the measuring head. The air bearing guide rail has extremely high walking parallelism, and cooperates with the high-precision grating ruler, the reading of the grating ruler can be directly regarded as the reading of the vision system 1 in the first embodiment without compensation. The linear scale of the visual system 2 is shortened and fixed on the connecting plate 41, and moves together with the connecting plate 41, which is only used as the offset reading of the measuring head. The second embodiment simplifies the complexit...

Embodiment 3

[0088] Such as Figure 13 As shown, compared with the second embodiment, the length of the linear scale 2 (the second linear scale) is not changed in the third embodiment and is still fixed on the micrometer support plate, and the high-precision grating scale is changed to a low-precision grating scale. It is only used as the feedback encoder of the linear motor, and the absolute offset and the relative offset of the probe are both read from the linear scale 2 by the camera 2 (second camera). The third embodiment has the characteristics of the simple hardware structure and software algorithm of the second embodiment, and does not use high-precision grating ruler reading at the same time, and maintains the low-cost linear ruler reading method in the first embodiment. Therefore, the third embodiment is three embodiments The best embodiment in .

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Abstract

The invention discloses an intelligent verification system for a micrometer. The system comprises a control module, a tabletop and a clamping mechanism; the clamping mechanism is arranged at the position of a micrometer supporting plate, and a positioning mechanism is arranged at the position, on the rear part of the micrometer supporting plate, of a tabletop frame; a fixed measuring anvil locating groove and a movable measuring anvil locating groove are formed in the locating mechanism; a first visual module, a second visual module and a third visual module are further arranged at the position, on the rear portion of the micrometer supporting plate, of the tabletop. When the micrometer is verified, a micrometer differential cylinder reaches an initial position; a measuring head moves andis connected with a fixed measuring anvil and a movable measuring anvil in sequence; the control module acquires the reading of a first linear scale when the measuring head is in contact with the fixed measuring anvil, and a second camera obtains the transverse relative moving position of the measuring head according to the reading of a second linear scale; the initial position and stop position of the measuring head are converted into a coordinate sequence to calculate the parallelism error of the measuring surfaces of the fixed and movable measuring anvils; the measurement reliability and the detection efficiency can be greatly improved, and convenience is brought to detection personnel for operation.

Description

technical field [0001] The invention relates to the technical field of measuring instruments, in particular to an intelligent verification system and detection method for a micrometer. Background technique [0002] At present, there are some automatic methods for micrometer verification, but these verification methods often have some shortcomings, such as the displacement and deformation of the micrometer during verification, the deformation of the physical measuring block, and the influence of the mechanical deformation of the verification mechanism on the verification accuracy. How to solve it is a research direction. Contents of the invention [0003] The invention provides a micrometer intelligent verification system and detection method, which can greatly improve measurement reliability and detection efficiency, and bring convenience to the operation of detection personnel. [0004] The present invention adopts the following technical solutions. [0005] An intellig...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B3/18
CPCG01B3/18
Inventor 涂宝章黄友杰
Owner 三明图灵智能科技有限公司
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