Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Memory cell and formation method, and storage array structure and formation method

A storage unit and storage array technology, applied in the direction of electrical components, electrical solid devices, circuits, etc., can solve the problems of storage structure performance to be improved, and achieve the effect of improving position accuracy, small area, and increasing lithography process window

Active Publication Date: 2018-10-09
SEMICON MFG INT (SHANGHAI) CORP +1
View PDF9 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] However, the performance of the storage structure formed by the prior art still needs to be improved

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Memory cell and formation method, and storage array structure and formation method
  • Memory cell and formation method, and storage array structure and formation method
  • Memory cell and formation method, and storage array structure and formation method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0033] It can be known from the background art that the performance of the storage structure formed in the prior art needs to be improved.

[0034] It is found through analysis that with the development of devices toward miniaturization and miniaturization, the lithography process window of the well region required to form the diode in the storage structure is getting smaller and smaller, so that the performance of the formed storage structure needs to be improved.

[0035] In order to solve the above problems, the present invention provides a method for forming a memory cell, so that the photolithographic process window of the well region in the diode is increased, thereby improving the performance of the formed memory cell.

[0036] In order to make the above objects, features and advantages of the present invention more comprehensible, specific embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0037] Fig...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A memory cell and a formation method, and a storage array structure and a formation method are disclosed. The formation method of the memory cell comprises the following steps of providing a substrate, wherein the substrate includes a first diode region, a second diode region, a third diode region, and a fourth diode region which are successively arranged along a row direction; forming first wellregions in the substrate of the first diode region and the second diode region; forming a second well regions in the substrate of the third diode region and the fourth diode region, wherein the dopingtype of the second well region is different from the doping type of the first well region; forming doped conductive regions in the first well region and the second well region; and forming a deep groove isolation structure in the substrate, wherein the deep groove isolation structure electrically isolates the first well region of the first diode region from the first well region of the second diode region, and electrically isolates the second well region of the third diode region from the second well region of the fourth diode region. In the invention, a photoetching technology window formingthe well region is added so that the formed memory cell and a memory array structure area can be made smaller.

Description

technical field [0001] The invention relates to the technical field of semiconductor manufacturing, in particular to a storage unit and its forming method, a storage array structure and its forming method. Background technique [0002] Semiconductor memory is an indispensable part of various electronic equipment systems, and non-volatile semiconductor memory has the characteristics of being able to save data even when the power is turned off, so it is widely used in various mobile and portable devices, such as mobile phones and notebooks , Pocket PC, etc. Resistive random access memory (RRAM, Resistance Random Access Memory) has the advantages of simple preparation process, fast read and write speed, high storage density, non-volatile and good compatibility with traditional silicon integrated circuit technology, so it is widely used in the field of semiconductor memory It has great application potential. [0003] RRAM is a non-volatile memory developed based on the electri...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H01L27/24H01L45/00
CPCH10B63/22H10N70/011H01L21/76224H10B63/20H10B63/80H10N70/826H01L29/0649H01L21/265
Inventor 仇圣棻曹恒
Owner SEMICON MFG INT (SHANGHAI) CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products