Method for measuring magnetism of surface nanostructure

Abstract

The invention relates to a magnetism measuring method in the field of optical technology measurement. A method for measuring magnetism of a surface nanostructure adopts a measuring device comprising alaser, a delayer, a quarter wave plate, a concave lens, a convex lens I, a plane mirror, a polarizer, a beam splitter, a convex lens II, a lens table, an atomic force microscope I, a probe I, a lensholder, an objective lens, a sample, a Hall plate, a sample table, a signal generator, an oscilloscope, a detector, a magnet, a preamplifier, a differential amplifier, a compensator, an analog-digitalconverter, a computer, an atomic force microscope II and a probe II, wherein the magnet is formed by connecting four identical sub-magnet cables. A high-precision positioning device is used to obtainmagnetization information of a surface of a nanometer sample, so that the single nanostructure can be measured; the measurement on magnetization dynamics of the surface of the sample can achieve a spatial resolution at a sub-micron level; nanoscale magnetization dynamic characteristics can be obtained without extracting information of micro-magnetization fluctuation of the surface of the sample by depending on a phase sensitivity detection technology.

Description

technical field [0001] The invention relates to a magnetic measurement method in the field of optical technology measurement, in particular to a low-cost surface nanostructure magnetic measurement method based on a loop measurement method. Background technique [0002] The magneto-optical Kerr effect measurement device is an important means in the study of material surface magnetism. Its working principle is based on the magneto-optic Kerr effect caused by the interaction between light and magnetized media. Magnetic detection, and non-contact measurement can be realized, and it has important applications in the research of magnetic order, magnetic anisotropy, interlayer coupling and phase transition behavior of magnetic ultrathin films. The magneto-optical Kerr effect measurement device mainly detects the magnetization observation of the sample surface by detecting the change of the polarization state of a beam of linearly polarized light after it is reflected on the surface...

AI Technical Summary

Problems solved by technology

The magneto-optical Kerr effect measurement device mainly detects the magnetization observation of the sample surface by detecting the change of the polarization state of a beam of linearly polarized light after it is reflected on the surface of the material. Therefore, the imaging effect is easily limited by the optical elements. Technical defect one: The spatial resolution of the traditional focusing Kerr microscope using microscope objective lens is determined by the optical diffraction limit, so it is impossible to obtain the dynamic characteristics of magnetization at the nanometer scale; existing technical defect two: the device based on the phase-sensitive detection method is relatively Complicated and expensive, the described method of magnetic measurement of surface nanostructures can solve the problem

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