SONOS memory and preparation method thereof
A technology of memory and charge storage layer, which is applied in the direction of electric solid-state devices, semiconductor devices, electrical components, etc., can solve the problem that the data retention ability needs to be improved, and achieve the effect of improving the data retention ability
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[0033] figure 1 It is a cross-sectional view of a typical SONOS memory structure. like figure 1 As shown, a typical SONOS memory structure is composed of silicon substrate 10 (S) - tunnel oxide layer 20 (O) - charge storage layer silicon nitride 30 (N) - blocking oxide layer 40 (O) - polysilicon gate 50 ( S) Composition. The principle of SONOS memory structure storage is: under the action of gate bias, electrons and holes in the substrate tunnel through the oxide layer to realize data writing and erasing.
[0034] However, the inventors found that the data retention of the SONOS memory is carried out without power supply, and as time goes by, the electrons or holes stored in the silicon nitride film continue to overflow and cause data loss. Therefore, a charge storage layer with a stronger charge storage capacity is needed to improve the charge storage capacity of the SONOS memory.
[0035] Based on the above findings, an embodiment of the present invention provides a SONO...
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