Double-wavelength time domain phase demodulation method based on equivalent wavelength pi/(2k) phase shift

A technology of equivalent wavelength and phase demodulation, applied in the field of optical measurement, can solve the problems of large elongation requirements of PZT and large number of sampling frames, and achieve the effect of increasing spectral spacing, reducing requirements, and being easy to extract.

Active Publication Date: 2018-11-09
NANJING UNIV OF SCI & TECH
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Problems solved by technology

[0005] The purpose of the present invention is to provide a dual-wavelength time-domain phase demodulation method based on the equivalent wavelength π / (2k) phase shift, which simultaneously solves the problem of relaxing the carrier frequency limit and the traditional time-domain Fourier transform algorithm in dual-wavelength The problem of large elongation requirements of PZT and large number of sampling frames in phase extraction

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  • Double-wavelength time domain phase demodulation method based on equivalent wavelength pi/(2k) phase shift
  • Double-wavelength time domain phase demodulation method based on equivalent wavelength pi/(2k) phase shift
  • Double-wavelength time domain phase demodulation method based on equivalent wavelength pi/(2k) phase shift

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Embodiment 1

[0072] combine figure 1 , a kind of dual-wavelength time-domain phase demodulation method based on equivalent wavelength π / (2k) phase shift of the present invention, the steps are as follows:

[0073] Step 1: Use a 100mm aperture dual-wavelength Fizeau interferometer with two wavelengths working at the same time to detect step-type optical components. The working wavelength of the interferometer is λ 1 =632.8nm and λ 2 =532nm, get the Moiré fringe pattern after superposition of the interference fringes of the two wavelengths, and turn to the second step.

[0074] The second step: considering the linearity of the 6.5μm elongation-voltage relationship curve of PZT, it is necessary to select the middle section with good linearity. Therefore, finally setting k=4 means to shift the phase by π / 8 of the equivalent wavelength. Therefore, the output voltage of the interferometer phase shifter is controlled to achieve the equivalent wavelength λ eq =3.339μm π / 8 phase shift step amou...

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Abstract

The invention discloses a double-wavelength time domain phase demodulation method based on equivalent wavelength pi/(2k) phase shift. According to the method, in the double-wavelength simultaneous phase-shifting interference detection, the extraction of an equivalent wavelength phase in a double-wavelength moire fringe is realized; phase shifting is carried out by taking pi/(2k) of the equivalentwavelength as a phase shifting stepping quantity, the moire fringe interference light intensity information is subjected to additive and multiplicative processing, a time domain phase-shifting interference processing method and a frequency spectrum gating technology are combined, and therefore an equivalent wavelength pi/(2k) phase-shifting interval interferogram is obtained; interferogram sequences with a pi/2 phase-shifting interval are extracted from the interferogram sequence at an interval of k frames o as to obtain an equivalent wavelength pi/2 phase-shifting interval interferogram; anda phase-shifting algorithm is utilized for processing, the extraction of the equivalent wavelength phase information of the moire fringe under the zero-carrier-frequency introduction condition is finally realized, so that the problem that a traditional moire fringe processing method in the dual-wavelength simultaneous phase-shifting interference is dependent on the space-domain carrier frequency can be solved.

Description

technical field [0001] The invention belongs to the technical field of optical measurement, in particular to a dual-wavelength time-domain phase demodulation method based on an equivalent wavelength π / (2k) phase shift. Background technique [0002] Phase-shifting interference detection has the advantages of high precision, non-contact and high degree of automation, so it has a wide range of applications in the testing of optical element surface shape, optical system performance and optical material characteristics. Traditional phase-shifting interferometric detection uses a single-wavelength laser light source, and its test range is limited by its operating wavelength. Therefore, when detecting a large gradient surface such as an aspheric surface, the interference fringes will be too dense, making it impossible to demodulate the phase. [0003] In order to solve the above problems, the following methods are usually adopted: first, improving the resolution of the detector can...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B9/02
Inventor 高志山胡捷袁群成金龙王帅于颢彪陈铭倪瑞沪
Owner NANJING UNIV OF SCI & TECH
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