Detection device for detecting silicon wafer positions, silicon wafer processing system and detection method
A detection device and detection method technology, applied in semiconductor/solid-state device testing/measurement, electrical components, semiconductor/solid-state device manufacturing, etc., can solve the problems that human eyes cannot continuously and stably complete high repeatability and intelligence, etc. Achieve the effect of avoiding visual fatigue, high efficiency and convenient maintenance
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[0024] The technical solutions in the embodiments of the present invention will be described in detail and completely below with reference to the drawings in the embodiments of the present invention.
[0025] figure 1 Shown is a schematic structural diagram of a specific embodiment of the detection device of the present invention, including: a driving mechanism, a camera module, a light source, and a distance measuring device.
[0026] The driving mechanism is provided with a square frame 1, and the detection surface of the frame 1 and the graphite boat 5 (such as Figure 4 (shown) match in size, guide rails 11 are provided on two opposite sides of the frame 1, and a middle guide rail 12 is arranged between the two guide rails, a bracket 2 is installed on the middle guide rail, and a camera module and a light source 4 are fixed on the bracket And the distance measuring device, etc., the motor can drive the bracket to move along the middle guide rail and drive the middle guide...
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