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Horizontal BRDF measuring device and method with effects of eliminating optical power instability influence and suppressing background radiation interference

A background radiation and measurement device technology, which is applied in the direction of measurement devices, scattering characteristic measurement, and material analysis through optical means, can solve the problems of lack of background stray radiation suppression function and the influence of unstable factors of incident light power, etc., to achieve flexibility Adjust, increase intensity, suppress interference effects

Inactive Publication Date: 2018-11-30
HARBIN INST OF TECH AT WEIHAI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The optical path structure of the traditional horizontal bireflectometer is relatively simple. Generally, only small light sources or optical fiber exit holes are installed on the rotating arm of the light source (such as Figure 5 shown), the experimental results are easily affected by the unstable factors of the incident light power, and at the same time, it lacks the suppression function of background stray radiation

Method used

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  • Horizontal BRDF measuring device and method with effects of eliminating optical power instability influence and suppressing background radiation interference
  • Horizontal BRDF measuring device and method with effects of eliminating optical power instability influence and suppressing background radiation interference
  • Horizontal BRDF measuring device and method with effects of eliminating optical power instability influence and suppressing background radiation interference

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Embodiment 1

[0037] Embodiment 1: as figure 1 and figure 2 As shown, the horizontal BRDF measurement device of this embodiment has the functions of eliminating the unstable influence of optical power and suppressing background radiation interference,

[0038] Including light source 1, total reflection optical fiber 2, light source collimator 3, aperture A4, polarizer 5, optical chopper 6, beam splitter 7, static detector 8, aperture B9, sample to be tested 10, sample Table 11, dynamic detector 12, light source rotating arm 13, detector rotating arm 14, transconductance amplifier A15, transconductance amplifier B16, lock-in amplifier 17, angle controller 18 and data acquisition and control system 19;

[0039] The light source collimator 3, diaphragm A4, polarizer 5, light chopper 6, beam splitter 7, static detector 8 and diaphragm B9 are installed on the light source rotating arm 13 along the optical path; 12 is installed on the detector rotating arm 14;

[0040] The optical path is: t...

Embodiment 2

[0043] Embodiment 2: as figure 1 and figure 2 As shown, the horizontal BRDF measurement method of this embodiment that eliminates the influence of optical power instability and suppresses background radiation interference relies on the horizontal BRDF measurement method described in Embodiment 1 that eliminates the influence of optical power instability and suppresses background radiation interference The device realizes, specifically:

[0044] The laser light emitted by the light source 1 (take the laser light source as an example) successively passes through the total reflection optical fiber 2, the light source collimator 3, the aperture A4, the polarizer 5 and the optical chopper 6 and reaches the beam splitter 7, and the laser light passes through the beam splitter 7 After that, it is divided into two beams of laser light, and the two beams of light form an angle of 90 degrees. One of the laser beams passes through the aperture B9 and irradiates the surface of the samp...

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Abstract

The invention discloses a horizontal BRDF measuring device and method with effects of eliminating optical power instability influence and suppressing background radiation interference, belongs to thefield of optical radiation characteristic measurement, and solves the problem that a traditional horizontal two-way reflectometer has large measurement errors due to instability factors of incident light power and background spurious radiation signal interference during a measurement process. Technical points are as follows: a light source passes through total reflection fiber, a light source collimator, an aperture A, a polarizer and a photochopper to a beam splitter, laser is splitted into two beams of laser after passing through the beam splitter, one beam passes through an aperture B, andis irradiated on the surface of a sample to be tested, the sample to be tested is placed on a sample stage, and the other laser beam is received by a static detector; reflected light of the sample tobe tested is received by a dynamic detector; the detector is connected with a lock-in amplifier through a transconductance amplifier, the lock-in amplifier is connected with a data acquisition and control system, and the data acquisition and control system controls the rotation angle of a light source rotation arm and a detector rotation arm through an angle controller. The horizontal BRDF measuring device is used in the measurement of optical radiation characteristics.

Description

technical field [0001] The invention relates to a horizontal BRDF measuring device and method, in particular to a horizontal BRDF measuring device and method capable of eliminating the influence of optical power instability and suppressing background radiation interference, belonging to the field of optical radiation characteristic measurement. Background technique [0002] The bidirectional reflectance distribution function (Bidirectional Reflectance Distribution Function, BRDF) can describe the spatial reflection distribution characteristics of different material surfaces, and can reflect almost all optical characteristics except geometric characteristics. , computer image processing, target recognition and research on the optical properties of materials have important applications. [0003] The measurement of BRDF is to measure the distribution characteristics of the intensity signal of the material surface in different reflection directions under the condition of light i...

Claims

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Application Information

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IPC IPC(8): G01N21/47
CPCG01N21/4738G01N2021/4776
Inventor 谢银模谭建宇张文杰马兰新景琳
Owner HARBIN INST OF TECH AT WEIHAI