The present invention discloses a high-sensitivity photothermal deflection spectrum test device and calibration method, comprising mutually perpendicular detection light path and pump light path, wherein a pump
light source, a
monochromator, an
optical chopper, a pump light lens group and an
absorption cell are sequentially arranged along the pump light path; a detection
light source, a spatial filtering
system, a detection light focusing lens, an
absorption cell and a position-sensitive
detector are sequentially arranged along the detection light path; the
signal output end of the position-sensitive
detector is connected to the
signal input end of a phase-locked
amplifier, and the output end of the phase-locked
amplifier is connected to a computer; the
signal control end of the
monochromator is connected to a computer, and the signal output end of the
optical chopper is connected to the signal input end of the phase-locked
amplifier; the spatial filtering
system comprises a spatial filtering focusing lens, a micropore, a spatial filtering collimating lens and an aperture arranged along the light path. By utilizing the present invention, the
test sensitivity of the photothermal deflection spectrum can be improved, so that the test accuracy of the thin film
absorbance can reach 10 <supgt;‑5< / supgt;~10<supgt;‑4< / supgt;。