Method for measuring second excitation potential of argon atoms

A technology of excitation potential and measurement method, which is applied in measuring devices, measuring electrical variables, measuring current/voltage, etc., can solve problems such as difficulty in obtaining high-energy electrons, difficulty in observing the excitation potential of argon atoms, and few measurement studies

Active Publication Date: 2018-12-07
CHANGAN UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Therefore, it is difficult to obtain high-energy electrons, and it is difficult to observe the higher excitation potential of argon atoms, and there are relatively few studies on the measurement of higher excitation potentials of argon atoms.

Method used

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  • Method for measuring second excitation potential of argon atoms
  • Method for measuring second excitation potential of argon atoms
  • Method for measuring second excitation potential of argon atoms

Examples

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Embodiment 1

[0082] Take plate reverse voltage V' 2 =-5(V), filament voltage V' 3 =2.5(V), the first gate voltage V' 4=1.8(V) to measure the first excitation potential U of the argon atom 1 , and with plate reverse voltage V 2 =-2(V) and filament voltage V 3 = 4 (V) to measure the second excitation potential U of the argon atom 2 As an example.

[0083] Firstly, the traditional quadrupole tube Frank-Hertz experimental device (see figure 1 ) to measure the first excitation potential U of the argon atom 1 , image 3 is the plate reverse voltage V' 2 =-5(V), filament voltage V' 3 =2.5(V), the first grid voltage V' 4 =1.8(V) to measure the first excitation potential U of the argon atom 1 Plate current I′ when P With the acceleration voltage V' 1 The change curve of I′ P ~V' 1 curve. from image 3 It can be seen that initially when the accelerating voltage V' 1 Plate current I when increasing from 0(V) to 5(V) p 'The reason why it remains at 0(A) is due to the plate reverse v...

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Abstract

The invention provides a method for measuring the second excitation potential of argon atoms. According to the method, the acceleration of electrons and the collision of the electrons with the argon atoms are performed in two regions respectively; a first gate G1 and a second gate G2 are connected and are maintained at the same potential; the potential difference deltaU of a corresponding second excitation potential U2' and first second excitation potential U1' during the excitation process of the argon atoms in the presence of a contact voltage and space charges is determined on the basis ofthe curve IP-V1 of the change of plate current IP with an acceleration voltage V1; and the influence of the contact voltage and the space charges is eliminated through using the difference between thesecond excitation potential U2' and first second excitation potential U1, so that the potential difference deltaU of the second excitation potential U2 and first second excitation potential U1 of theargon atoms is obtained; and on the basis of the first excitation potential U1 of the argon atoms which is determined with a conventional method, the second excitation potential U2 of the argon atomsis determined according to an equation that U2=U1+deltaU. With the method for measuring the second excitation potential of the argon atoms of the invention, the measurement of the high excitation potential of the argon atoms from a ground excited state to a second excited state. The method is of reference significance for the study of the high excitation potential of the argon atoms. According tothe method, measuring equipment is relatively simple, high cost investment is not required, and measurement results are accurate and reliable.

Description

technical field [0001] The invention belongs to the technical field of physics, specifically the technical fields of atomic and molecular physics and quantum mechanics, and particularly relates to a method for measuring the second excitation potential of an argon atom. Background technique [0002] The internal energy of atoms is quantized, and the measurement of atomic energy levels is the key to understanding the internal structure of atoms. Atoms can change their state by absorbing (or emitting) electromagnetic radiation or colliding with other particles to exchange energy. In order to achieve the atom from the ground state E 1 Excited to excited state E n , can be realized by absorbing photons of a certain frequency ν, for which hν=E n -E 1 , where h=6.626176×10 -34 (J·s) is Planck's constant. It can also be achieved by colliding with electrons with a certain energy. If the colliding electrons obtain energy eU through the accelerating voltage U, as long as eU=E n...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R19/00
CPCG01R19/00
Inventor 张研
Owner CHANGAN UNIV
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