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Langmuir probe, Langmuir probe diagnostic system and diagnostic method thereof

A technology of Langmuir probe and diagnostic method, which is applied in the direction of electrical components, plasma, etc., and can solve problems such as large measurement error and collection area error

Inactive Publication Date: 2018-12-28
BEIHANG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] When using a Langmuir probe, the collector usually uses a bare metal lead to extend the probe into the plasma, and the lead also collects electrons and ions, resulting in errors in the collection area, resulting in large measurement errors

Method used

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  • Langmuir probe, Langmuir probe diagnostic system and diagnostic method thereof
  • Langmuir probe, Langmuir probe diagnostic system and diagnostic method thereof
  • Langmuir probe, Langmuir probe diagnostic system and diagnostic method thereof

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Embodiment

[0048] According to one aspect of the present invention, there is provided a Langmuir probe, such as figure 1 as well as figure 2 as shown, figure 1 Schematic diagram of the structure of the Langmuir probe provided for the embodiment of the present invention; figure 2 A sectional view of a bottom view of a Langmuir probe provided for an embodiment of the present invention; including a collector 101, a conductive screw lead 102, a ceramic sheath 103, and a hex nut 104;

[0049] The conductive screw lead 102 is screwed into the collector and connected to the collector 101. The ceramic sheath 103 is sleeved on the conductive screw lead 102, and one end is in contact with the collector 101. The hex nut 104 is screwed to the conductive screw lead 102. connected and abuts against the other end of the ceramic sheath 103 .

[0050] According to the Langmuir probe of the present invention, for the Langmuir probe, the Langmuir probe 10 includes a collector 101, a conductive screw l...

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Abstract

The invention discloses a Langmuir probe, a Langmuir probe diagnostic system and a diagnostic method thereof, which relate to the technical field of plasma. The Langmuir probe according to the invention comprises a collector, an electrically conductive screw lead, a ceramic sheath and a hexagon nut; the conductive screw lead is screwed into the collector and connected with the collector, the ceramic sheath is arranged on the conductive screw lead, and one end part is in contact with the collector, and the hexagon nut is screwed with the conductive screw lead and in contact with the other end part of the ceramic sheath; The Langmuir probe can avoid the contact between the lead wire and the plasma, eliminate the lead wire interference and reduce the measurement error.

Description

technical field [0001] The invention relates to the technical field of medical equipment, in particular to a Langmuir probe, a Langmuir probe diagnostic system and a diagnostic method thereof. Background technique [0002] Electric thrusters such as ion thrusters and Hall thrusters are widely used in spacecraft attitude and orbit control because of their advantages such as high specific impulse, long life and small system mass. Accurately obtaining the parameters of the electric thruster vacuum plume is crucial for evaluating the performance of the electric thruster and spacecraft; the vacuum plume of the electric thruster is plasma, and the electron temperature and electron number density are the basic parameters of the plasma plume flow field. Obtaining electron temperature and electron number density is an important prerequisite for studying plasma properties, and Langmuir probes are usually used to diagnose the electron temperature and electron number density of the isoe...

Claims

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Application Information

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IPC IPC(8): H05H1/00
CPCH05H1/0075
Inventor 翁惠焱刘立辉韩木天贺碧蛟蔡国飙
Owner BEIHANG UNIV
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