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A log management system and method for semiconductor memory aging test

A technology of aging test and management method, applied in the field of log management, can solve the problems of scattered log management and poor fault tolerance, and achieve the effect of good fault tolerance

Inactive Publication Date: 2019-01-22
武汉精鸿电子技术有限公司
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Problems solved by technology

[0004] The embodiment of the present application provides a log management system and method for semiconductor memory burn-in test, which solves the problem of scattered log management and poor fault tolerance of semiconductor memory burn-in test in the prior art

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  • A log management system and method for semiconductor memory aging test
  • A log management system and method for semiconductor memory aging test
  • A log management system and method for semiconductor memory aging test

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Embodiment Construction

[0025] In order to better understand the above-mentioned technical solution, the above-mentioned technical solution will be described in detail below in conjunction with the accompanying drawings and specific implementation methods.

[0026] A functional block diagram of a log management system for a semiconductor memory aging test provided by the present invention is as follows figure 1 shown. Wherein, the upper part represents the processing process of the log client (that is, the test equipment, specifically semiconductor memory aging test equipment), and the lower part describes the processing process of the log server. Such as figure 1 As shown, when the log client uses the log function, it first initializes the log, sets the IP address and port port of the log server, and then sets the log level according to the actual business needs, and then records the log at the core and key places. The log client After recording the log, the terminal can directly print the log on ...

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Abstract

The invention belongs to the technical field of log management, and discloses a log management method and a system for semiconductor memory aging test, comprising a log server end and at least one logclient end. The log client stores the log files generated in the running process locally, displays the log files through the console, and sends the log files to the log server. The log server receives and saves log files sent from the log client. The invention solves the problems of decentralized log management and poor fault tolerance of semiconductor memory aging test in the prior art, and provides a scalable and high fault tolerance scheme for ' distributed collection and unified processing ' of the log.

Description

technical field [0001] The invention relates to the technical field of log management, in particular to a log management system and method for semiconductor memory aging test. Background technique [0002] Semiconductor memory (semi-conductor memory) is an important component of modern digital systems, especially computer systems. With the increasing integration of semiconductor memory, the size of semiconductor device particles is getting smaller and smaller, and the failure rate of semiconductor devices also increased. The reliability of semiconductor storage devices determines whether the test equipment can run stably and reliably. [0003] In the actual operating environment, it is occasionally found that a module function of the semiconductor test equipment system will be lost. Similar problems did not appear during local testing, but they may occur when deployed in the actual environment. However, it is impossible for us to manually monitor the system 24 hours a day...

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Application Information

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IPC IPC(8): H04L12/24
CPCH04L41/069
Inventor 艾鹏
Owner 武汉精鸿电子技术有限公司
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