Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Intelligent CVC-200T hardware test system and method

A CVC-200T, test system technology, applied in the field of CVC-200T hardware intelligent test system, can solve the problems of inability to meet the needs of large-scale board product testing, shorten the time to market, and complex design, so as to shorten the time to market. The effect of high time and test point coverage and convenient operation

Pending Publication Date: 2019-02-15
CASCO SIGNAL
View PDF4 Cites 19 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] There are many types of CVC-200T boards, and the design is extremely complex. It consists of many sub-modules. Manual testing can no longer meet the needs of large-scale board product testing.
This complexity makes engineers face daunting challenges in reducing verification and test costs, more accurate and reliable measurements, and shortening time to market

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Intelligent CVC-200T hardware test system and method
  • Intelligent CVC-200T hardware test system and method
  • Intelligent CVC-200T hardware test system and method

Examples

Experimental program
Comparison scheme
Effect test

specific Embodiment

[0067] like figure 1 As shown, the industrial computer controls other boards in the NI chassis by communicating with the NI PXI-PCI 8360 board. Two PXI 8512 boards are connected to the CMU board through a 100-meter CAN transmission line, and the PXI 8431 board is connected to the CMU board for RS422 serial port communication. , PXI 6509 digital IO board is connected with MLU board for simulating fan signal, connected with CMU board for simulating train automatic control ATO signal, DATAPLUG (EEPROM) is connected with MLU and CMU board. Industrial computer, gigabit switch, simulated 100-meter-long 100M / gigabit network load board, and the tested board MLU / CMU board are connected in sequence. The upper computer software runs on the industrial computer, and the lower computer software runs on the tested board. The tested board communicates with the host computer software through the debugging network port. The industrial computer and the tested board MLU / CMU board communicate thro...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to an intelligent CVC-200T hardware test system and method. The test system comprises a tested board card, an NI PXI chassis, a matched board card, a network load board, an industrial computer, a Gigabit switch, a display, a keyboard mouse and a scanning gun, wherein the tested board card comprises a main logic unit MLU board and a communication management unit CMU board; theindustrial computer is an upper computer and operates an upper computer test program of NI-based visual programming software LabVIEW; the tested board card is a lower computer and operates a CVC-200Tboard card lower computer test program; the industrial computer sends a control command to the tested board card and receives test data fed back by the tested board card so as to automatically determine a test result; the display and keyboard mouse are used for human-computer interaction; and the scanning gun is used for inputting a two-dimensional code and MAC address information of the tested board card. Compared with the prior art, the system and method have the following advantages that a human-machine interface is more friendly, the operation is convenient, the development cost is reduced, the secondary development cycle is shorter and the like.

Description

technical field [0001] The invention relates to the field of railway signal equipment systems, in particular to a CVC-200T hardware intelligent testing system and method. Background technique [0002] There are many types of CVC-200T boards, and the design is extremely complex. It consists of many sub-modules. Manual testing can no longer meet the needs of large-scale board product testing. This complexity makes engineers face daunting challenges in reducing verification and test costs, more accurate and reliable measurements, and shortening time to market. Contents of the invention [0003] The purpose of the present invention is to provide a CVC-200T hardware intelligent testing system and method in order to overcome the above-mentioned defects in the prior art. [0004] The purpose of the present invention can be achieved through the following technical solutions: [0005] A CVC-200T hardware intelligent test system, the test system includes the tested board, NI PXI c...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
CPCG01R31/28
Inventor 王洪亮李常辉丁辉
Owner CASCO SIGNAL
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com