Test system and measurement method for rotary magnetic property of nano-crystalline

A technology for testing system and magnetic characteristics, applied in the direction of magnetic performance measurement, measurement device, measurement of magnetic variables, etc., can solve the problem that the detection device cannot realize the rotating magnetic characteristics at high frequency, the utilization rate of the rectangular structure window of the excitation winding is low, and the H sensor and the The problem of increasing the distance between the surface of the sample, etc., can improve the utilization rate of the window, reduce the difficulty of excitation, and reduce the leakage of magnetic flux.

Active Publication Date: 2019-03-05
HEBEI UNIV OF TECH
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Problems solved by technology

[0003] In the prior art magnetic characteristic detection device, the magnetic circuit structure adopts a single C-ring structure, and the magnetic circuit symmetry is poor; the field winding adopts a rectangular structure with low window utilization, and the problem of magnetic flux leakage is prominent; High core loss, serious heating problem
The detection device in the prior art cannot realize the simulation of the rotating magnetic characteristics at high frequency
[0004] In the prior art magnetic characteristic detection device, the B and H sensors have low integration and require a large uniform magnetic field area, and the B sensor adopts the method of punching holes, which is easy to destroy the magnetic characteristics of the sample; it is easy to cause wire insulation in the process of wire perforation If the H sensor is placed above the B sensor, the distance between the H sensor and the sample surface will increase, which will increase the test error, and if it is not placed above the H coil, it will increase the area of ​​the uniform magnetic field area.

Method used

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  • Test system and measurement method for rotary magnetic property of nano-crystalline
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  • Test system and measurement method for rotary magnetic property of nano-crystalline

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Embodiment Construction

[0036] The technical solutions of the present invention will be clearly and completely described below in conjunction with the accompanying drawings of the present invention. Apparently, the described embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0037] figure 1 It is a nanocrystalline rotating magnetic characteristic testing system. NI industrial computer 1 sends out an excitation signal. The excitation signal is output from the output terminal of the LabVIEW board 2 and amplified by the power amplifier 3 to drive two pairs of axially orthogonal excitation windings 10. An impedance matching capacitor box 4 where the inductance resonates and a high-power resistor 5 for short-circuit protection. The B-H composite magnetic sensor 38...

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Abstract

The invention discloses a test system and measurement method for the rotary magnetic property of nano-crystalline, and belongs to magnetic property measurement equipment of nano-crystal materials. Thetest system comprises an NI industrial control computer, a LabVIEW signal generation and collection board, a rotary magnetic property tester, a power amplifier, an impedance matching capacitance box,a B-H composite magnetic sensor and a differential amplification circuit. Two orthogonal magnetic circuits are of a symmetric double-yoke structure, the two magnetic circuits implement excitation independently, and alternate excitation in any direction within a circle, oval and plane can be carried out according to practical condition. The B-H composite magnetic sensor is composed of two H coilsand four probes, the two H coils vertical to the window direction can be wound around a detachable square inner-ring PCB substrate to test the magnetic field intensities H in the two orthogonal directions, the four steel probes are mounted on an outer PCB substrate pairwise, and every two probes in the same pair test the flux density B in one direction. Weld points and lead fixing holes are designed in the outer PCB substrate. Shimming protective layers are arranged in the two sides of a test sample respectively, the uniformity of a test area is ensured, and the test efficiency is improved.

Description

technical field [0001] The invention relates to a nanocrystal rotating magnetic characteristic detection device, in particular to a nanocrystal rotating magnetic characteristic testing system and a measuring method. Background technique [0002] There is a rotating magnetic field at the T-shaped junction of the nanocrystalline core three-phase high-frequency transformer, resulting in rotational loss. The existing ring sample test method cannot test the rotating magnetic field, and it is difficult to accurately calculate the loss of the nanocrystalline core three-phase high-frequency transformer. Therefore, it is necessary to build a test device for the rotational magnetic properties of nanocrystals. The detection of the rotating magnetic properties of nanocrystals is based on Faraday's law of electromagnetic induction and the eddy current effect under an alternating magnetic field to obtain the magnetic field signal in the sample. The sample is excited by two pairs of axial...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R33/12
CPCG01R33/1284
Inventor 李永建王利祥李昂轩张长庚陈瑞颖
Owner HEBEI UNIV OF TECH
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