Fluorescent x-ray analyzer and fluorescent x-ray analysis method

An analysis device and X-ray technology, applied in the direction of material analysis, measurement device, and material analysis using wave/particle radiation, can solve the problems of deviation of analysis results, preparation time, labor and time, etc., to achieve noise suppression, The effect of reduced preparation time and efficient detection

Active Publication Date: 2019-03-12
HITACHI HIGH TECH SCI CORP
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Problems solved by technology

[0003] In the case of detecting heavy metals such as cadmium contained in trace amounts in samples mainly composed of light elements such as rice grains or rice flour, ICP (Inductive Plasma Luminescence Analysis) has been performed conventionally, but there is a problem that the sample needs to be Th

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  • Fluorescent x-ray analyzer and fluorescent x-ray analysis method
  • Fluorescent x-ray analyzer and fluorescent x-ray analysis method
  • Fluorescent x-ray analyzer and fluorescent x-ray analysis method

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Embodiment Construction

[0036] Below, refer to figure 1 and figure 2 A first embodiment of the fluorescent X-ray analysis device and the fluorescent X-ray analysis method of the present invention will be described.

[0037] Such as figure 1 As shown, the fluorescent X-ray analysis device 1 of this embodiment has: a sample container 4 that can accommodate a granular or powdery sample S; an X-ray source 2 that irradiates the sample S with primary X-rays. X1; a detector 3 that detects the fluorescent X-ray X2 generated from the sample S irradiated with the primary X-ray X1; and an irradiation range changing mechanism 5 that can change the irradiation source to the sample S in the sample container 4. Grade X-ray X1 scope.

[0038] Such as figure 1 As shown in (b), the above-mentioned irradiation range changing mechanism 5 can be changed to local irradiation and wide-area irradiation. Sample S irradiates primary X-ray X1, in this wide-range irradiation, such as figure 1 As shown in (a), the sample ...

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Abstract

The invention provides a fluorescent X-ray analyzer and a fluorescent X-ray analysis method capable of measuring elements having different analysis depths without changing the arrangement in the samesample container. The fluorescent X-ray analyzer includes a sample container (4) capable of accommodating the sample (S), an X-ray source (2) that irradiates the sample with the primary X-ray (X1), and a detector (3) detecting fluorescent X-ray (X2) generated from the sample irradiated with the primary X-ray; and an irradiation range changing mechanism (5) capable of changing the range in which the original X-ray is irradiated to the sample in the sample container, to partial irradiation and wide-range irradiation. In partial irradiation, at least the sample of the wall surface facing the sample container facing the sample container is irradiated with the primary X-ray; and in the wide-range irradiation, the sample in the sample container is irradiated with the original X-rays in a range larger than that of the local irradiation.

Description

technical field [0001] The present invention relates to a fluorescent X-ray analysis device and a fluorescent X-ray analysis method capable of detecting metal elements and the like contained in samples such as food and medical products. Background technique [0002] Fluorescent X-ray analysis refers to irradiating a sample with X-rays emitted from an X-ray source, and using an X-ray detector to detect fluorescent X-rays emitted from the sample with energy inherent to the element, thereby obtaining Spectrum, for qualitative analysis or quantitative analysis of the sample. Since a sample can be analyzed quickly and non-destructively, this fluorescent X-ray analysis is widely used in processes, quality control, and the like. In recent years, the use of fluorescent X-ray analysis for the detection or quantification of cadmium (Cd) and the like in foods has been discussed. [0003] In the case of detecting heavy metals such as cadmium contained in trace amounts in samples mainl...

Claims

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Application Information

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IPC IPC(8): G01N23/223
CPCG01N23/223G01N2223/076G01N2223/30
Inventor 深井隆行的场吉毅大柿真毅
Owner HITACHI HIGH TECH SCI CORP
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