Fluorescent x-ray analyzer and fluorescent x-ray analysis method

An analysis device and X-ray technology, applied in the direction of material analysis, measurement device, and material analysis using wave/particle radiation, can solve the problems of deviation of analysis results, preparation time, labor and time, etc., to achieve noise suppression, The effect of reduced preparation time and efficient detection
CN109459458AActive Publication Date: 2019-03-12HITACHI HIGH TECH SCI CORP
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Patent Information

Authority / Receiving Office
CN Β· China
Current Assignee / Owner
HITACHI HIGH TECH SCI CORP
Publication Date
2019-03-12

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Abstract

The invention provides a fluorescent X-ray analyzer and a fluorescent X-ray analysis method capable of measuring elements having different analysis depths without changing the arrangement in the samesample container. The fluorescent X-ray analyzer includes a sample container (4) capable of accommodating the sample (S), an X-ray source (2) that irradiates the sample with the primary X-ray (X1), and a detector (3) detecting fluorescent X-ray (X2) generated from the sample irradiated with the primary X-ray; and an irradiation range changing mechanism (5) capable of changing the range in which the original X-ray is irradiated to the sample in the sample container, to partial irradiation and wide-range irradiation. In partial irradiation, at least the sample of the wall surface facing the sample container facing the sample container is irradiated with the primary X-ray; and in the wide-range irradiation, the sample in the sample container is irradiated with the original X-rays in a range larger than that of the local irradiation.
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Description

technical field

[0001] The present invention relates to a fluorescent X-ray analysis device and a fluorescent X-ray analysis method capable of detecting metal elements and the like contained in samples such as food and medical products. Background technique

[0002] Fluorescent X-ray analysis refers to irradiating a sample with X-rays emitted from an X-ray source, and using an X-ray detector to detect fluorescent X-rays emitted from the sample with energy inherent to the element, thereby obtaining Spectrum, for qualitative analysis or quantitative analysis of the sample. Since a sample can be analyzed quickly and non-destructively, this fluorescent X-ray analysis is widely used in processes, quality control, and the like. In recent years, the use of fluorescent X-ray analysis for the detection or quantification of cadmium (Cd) and the like in foods has been discussed.

[0003] In the case of detecting heavy metals such as cadmium contained in trace amounts in samples mainl...

Claims

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