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General method and device for frequency extension multi-parameter automatic testing of microwave semiconductor devices

An automatic test device and frequency expansion technology, applied in the direction of single semiconductor device test, measurement device, non-contact test, etc., can solve the problems of complex test method, low test efficiency, single parameter category, etc., to improve the versatility and test Efficiency, reduced test cost and complexity, and ease of integration

Active Publication Date: 2021-08-31
CHINA ELECTRONIS TECH INSTR CO LTD +1
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Problems solved by technology

[0008] In order to solve the deficiencies of the prior art, the present disclosure provides a general method and device for frequency extension multi-parameter automatic testing of microwave semiconductor devices, which can realize multi-parameter testing of single connection and multiple testing on the basis of efficient integrated measurement and control Function, effectively solve the problems of single test function and parameter category based on traditional mode, complex test method, low test efficiency, etc., and meet the test needs of practical applications and higher technical requirements to the greatest extent in a generalized way

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  • General method and device for frequency extension multi-parameter automatic testing of microwave semiconductor devices

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[0039] The present disclosure will be further described below in conjunction with the accompanying drawings and specific embodiments.

[0040] It should be pointed out that the following detailed description is exemplary and intended to provide further explanation to the present application. Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs.

[0041] It should be noted that the terminology used here is only for describing specific implementations, and is not intended to limit the exemplary implementations according to the present application. As used herein, unless the context clearly dictates otherwise, the singular is intended to include the plural, and it should also be understood that when the terms "comprising" and / or "comprising" are used in this specification, they mean There are features, steps, operations, means, components and / or ...

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Abstract

The present disclosure provides a general method and device for frequency extension multi-parameter automatic testing of microwave semiconductor devices, including a main control unit, several test instruments and a test function circuit; the main control unit is configured to communicate with each test instrument through a measurement and control bus Connected to the test function circuit; the test instrument includes a signal generator, a signal / spectrum analyzer and a vector network analyzer, and the test instrument is configured to receive commands from the main control unit and send corresponding test signals to the test function circuit; The test function circuit is configured to process the test signal according to the command of the main control unit; and connect the microwave semiconductor device under test once in the form of waveguide, and cooperate with the corresponding test instrument to complete the frequency extension multi-parameter automatic test of the microwave semiconductor device under test.

Description

technical field [0001] The disclosure belongs to the technical field of microwave testing, and in particular relates to a general method and device for frequency extension multi-parameter automatic testing of microwave semiconductor devices. Background technique [0002] With the rapid development of microwave semiconductor technology, information and communication technology, the integrated functions and technical characteristics of microwave semiconductor devices have also been continuously improved, and higher requirements are put forward for the multi-parameter automatic test of microwave semiconductor devices in the frequency extension mode of waveguide connection. Therefore, newer and higher technical requirements are put forward for testing technology or related products. [0003] In the traditional mode, the parameter test of microwave semiconductor devices in the frequency extension mode of waveguide connection is mainly composed and realized by the architecture of ...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/26G01R31/265G01R23/18
CPCG01R23/18G01R31/2607G01R31/2656
Inventor 郭敏丁志钊王尊峰朱学波徐宝令
Owner CHINA ELECTRONIS TECH INSTR CO LTD